Using ridge regression models to estimate grain yield from field spectral data in bread wheat (Triticum Aestivum L.) grown under three water regimes

Remote Sensing

Volumn 7, Issue 2, 2015, Pages 2109-2126

  Hernandez, Javier ^a   Lobos, Gustavo A ^b   Matus, Iván ^c   del Pozo, Alejandro ^b   Silva, Paola ^a   Galleguillos, Mauricio ^a  

^a UNIVERSITY OF CHILE   (Chile)

^b UNIVERSIDAD DE TALCA   (Chile)

^c Agricultural Research Institute   (Chile)

Author keywords

Drought; High throughput; Plant selection; Reflectance; Spectroradiometer; Water stress

Indexed keywords

DROUGHT; FILLING; FORECASTING; IRRIGATION; PLANTS (BOTANY); REFLECTION; REGRESSION ANALYSIS; WATER TREATMENT;

ESTIMATION TECHNIQUES; HIGH THROUGHPUT; PLANT SELECTION; PREDICTIVE ABILITIES; SPECTRAL REFLECTANCES; SPECTRO-RADIOMETERS; WATER STRESS; WHEAT (TRITICUM AESTIVUM L.);

GRAIN (AGRICULTURAL PRODUCT);

EID: 84928813718     PISSN: None     EISSN: 20724292     Source Type: Journal    
DOI: 10.3390/rs70202109     Document Type: Article

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