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Volumn 11, Issue , 2007, Pages 535-539
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Enhanced cross-axis rejection capacitive strain gauge
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CAPACITANCE MEASUREMENT;
FINITE ELEMENT METHOD;
NANOSYSTEMS;
PLATES (STRUCTURAL COMPONENTS);
STRAIN GAGES;
STRUCTURAL DESIGN;
CAPACITIVE MEASUREMENTS;
CAPACITIVE PLATE;
CROSS-AXIS SENSITIVITY;
FINITE ELEMENT SIMULATIONS;
MECHANICAL ANALYSIS;
NOISE ASSESSMENTS;
PARASITIC CAPACITANCE;
SILICON-ON-INSULATORS;
SHEAR STRAIN;
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EID: 84928606662
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1115/IMECE200743168 Document Type: Conference Paper |
Times cited : (2)
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References (7)
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