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Volumn 45, Issue 5, 2015, Pages 805-818

A novel algorithm for wafer sojourn time analysis of single-arm cluster tools with wafer residency time constraints and activity time variation

Author keywords

Cluster tools; discrete event system; manufacturing; Petri net (PN); scheduling

Indexed keywords

DISCRETE EVENT SIMULATION; MANUFACTURE; PETRI NETS; SCHEDULING; SEMICONDUCTOR DEVICE MANUFACTURE; TOOLS;

EID: 84928482037     PISSN: 21682216     EISSN: 21682232     Source Type: Journal    
DOI: 10.1109/TSMC.2014.2368995     Document Type: Article
Times cited : (48)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.