Stochastic testing simulator for integrated circuits and MEMS: Hierarchical and sparse techniques

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014

Volumn , Issue , 2014, Pages

  Zhang, Zheng ^a   Yang, Xiu ^b   Marucci, Giovanni ^c   Maffezzoni, Paolo ^c   Elfadel, Ibrahim M ^d   Karniadakis, George ^b   Daniel, Luca ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b BROWN UNIVERSITY   (United States)

^c POLITECNICO DI MILANO   (Italy)

^d KHALIFA UNIVERSITY   (United Arab Emirates)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT DESIGN; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUITS; MONTE CARLO METHODS; SIMULATORS; STOCHASTIC SYSTEMS; TIMING CIRCUITS;

CHIP PERFORMANCE; CIRCUIT'S PERFORMANCE; COMPLEX CIRCUITS; MONTE CARLO ALGORITHMS; PROCESS VARIATION; SPARSE TECHNIQUES; SPEED-UP FACTORS; STOCHASTIC SIMULATORS;

CIRCUIT SIMULATION;

EID: 84928128161     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2014.6946009     Document Type: Conference Paper

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