SCOPUS 정보 검색 플랫폼

Volumn 67, Issue 3, 1990, Pages R1-R26

Deep donor levels (DX centers) in III-V semiconductors

a IBM T J WATSON RESEARCH CENTER (United States)

b FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF (Germany)

Author keywords

BAND STRUCTURE; CHARGE STATE; COLOR CENTERS; CONDUCTION BANDS; DEEP ENERGY LEVELS; DONORS; ELECTRICAL PROPERTIES; HETEROJUNCTIONS; III V SEMICONDUCTORS; INTERSTITIALS; OPTICAL PROPERTIES; TRANSPORT PROCESSES

Indexed keywords

EID: 84927992698 PISSN: 00218979 EISSN: 10897550 Source Type: Journal
DOI: 10.1063/1.345628 Document Type: Letter

Times cited : (753)

References (196)

1
- 36049058374
- PHRVAO 0031-899X
- (1968) Phys. Rev. , vol.168 , pp. 867
- Craford, M.G.¹ Stillman, G.E.² Rossi, J.A.³ Kolonyak, N.⁴

2
- 3542997016
- PRLTAO 0031-9007
- (1977) Phys. Rev. Lett. , vol.39 , pp. 635
- Lang, D.V.¹ Logan, R.A.²

3
- 12444262584
- PRBMDO 0163-1829
- (1979) Phys. Rev. B , vol.19 , pp. 1015
- Lang, D.V.¹ Logan, R.A.² Jaros, M.³

4
- 0018713215
- IPHSAC 0305-2346
- (1979) Inst. Phys. Conf. Ser. , vol.45 , pp. 199
- Bhattacharya, P.K.¹ Majerfeld, A.² Saxena, A.K.³

5
- 0000135383
- PRBMDO 0163-1829
- (1984) Phys. Rev. B , vol.30 , pp. 4481
- Chand, N.¹ Henderson, T.² Clem, J.³ Masselink, W.T.⁴ Fischer, R.⁵ Chang, Y.C.⁶ Morkoç, H.⁷

6
- 0000137962
- JAPIAU 0021-8979
- (1987) J. Appl. Phys. , vol.62 , pp. 4786
- Mooney, P.M.¹ Caswell, N.S.² Wright, S.L.³

7
- 0004005306
- (Wiley, New York)
- (1969) Physics of Semiconductor Devices , pp. 35
- Sze, S.M.¹

8
- 0002352465
- JCRGAE 0022-0248
- (1984) J. Cryst. Growth , vol.68 , pp. 48
- Kuech, T.F.¹ Veuhoff, E.² Meyerson, B.S.³

9
- 0022811247
- APSFDB 0721-7250
- (1986) Appl. Phys. A , vol.41 , pp. 237
- Gonzales, L.¹ Clegg, J.B.² Hilton, D.³ Gowers, J.P.⁴ Foxon, C.T.⁵ Joyce, B.A.⁶

10
- 0024104418
- JCRGAE 0022-0248
- (1988) J. Cryst. Growth , vol.93 , pp. 650
- Veuhoff, E.¹ Baumeister, H.² Treicher, R.³

11
- 0019918412
- IEEPAD 0018-9219
- (1982) Proc. IEEE , vol.70 , pp. 13
- Kroemer, H.¹

12
- 0342368341
- APPLAB 0003-6951
- (1978) Appl. Phys. Lett. , vol.33 , pp. 629
- Ilegems, M.¹ Swartz, B.² Koszi, L.A.³ Miller, R.C.⁴

13
- 0019009243
- IETDAI 0018-9383
- (1980) IEEE Trans. Electron Devices , vol.ED-27 , pp. 822
- Bedair, S.M.¹ Phatak, S.B.² Hauser, J.R.³

14
- 0022306430
- (IEEE, New York)
- (1985) Proceedings of the 18th IEEE Photovoltaic Specialists Conference , pp. 20
- Hutchley, J.A.¹ Markunas, R.J.² Timmons, M.L.³ Chiang, P.K.⁴ Bedair, S.M.⁵

15
- 0021469892
- IETDAI 0018-9383
- (1984) IEEE Trans. Electron Devices , vol.ED-31 , pp. 1015
- Solomon, P.M.¹ Morkoç, H.²

16
- 84918439806
- IPHSAC 0305-2346
- (1984) Inst. Phys. Conf. Ser. , vol.74 , pp. 623
- Mooney, P.M.¹ Solomon, P.M.² Theis, T.N.³

17
- 0039464011
- APPLAB 0003-6951
- (1985) Appl. Phys. Lett. , vol.47 , pp. 628
- Nathan, M.I.¹ Mooney, P.M.² Solomon, P.M.³ Wright, S.L.⁴

18
- 26344459293
- SUSCAS 0039-6028
- (1986) Surf. Sci. , vol.174 , pp. 431
- Nathan, M.I.¹ Mooney, P.M.² Solomon, P.M.³ Wright, S.L.⁴

19
- 0022675987
- ELLEAK 0013-5194
- (1986) Electron. Lett. , vol.22 , pp. 335
- Hoffman, K.R.¹ Kohn, E.²

20
- 84957281184
- (unpublished).
- Kiehl, R.A.¹ Mooney, P.M.² Nathan, M.I.³

21
- 84916459813
- IPHSAC 0305-2346
- (1982) Inst. Phys. Conf. Ser. , vol.65 , pp. 385
- Rochette, J.F.¹ DelEscluse, P.² Lavin, M.³ DelAgebeaudcuf, D.⁴ Chevrier, J.⁵ Linh, N.T.⁶

22
- 0021469752
- IETDAI 0018-9383
- (1984) IEEE Trans. Electron Devices , vol.ED-31 , pp. 1028
- Fisher, R.¹ Drummond, T.J.² Klem, J.³ Kopp, W.⁴ Henderson, T.S.⁵ Perrachione, D.⁶ Morkoç, H.⁷

23
- 0022025728
- JJPYA5 0021-4922
- (1985) Jpn. J. Appl. Phys. , vol.24 , pp. 377
- Kinoshita, H.¹ Nishi, S.² Akiyama, M.³ Ishida, T.⁴ Kaminishi, K.⁵

24
- 0022683296
- IETDAI 0018-9383
- (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 414
- Kastalsky, A.¹ Kiehl, R.A.²

25
- 0007641105
- APPLAB 0003-6951
- (1986) Appl. Phys. Lett. , vol.49 , pp. 1542
- Theis, T.N.¹ Parker, B.D.² Solomon, P.M.³ Wright, S.L.⁴

26
- 21544479649
- JAPIAU 0021-8979
- (1988) J. Appl. Phys. , vol.63 , pp. 1541
- Kirtley, J.R.¹ Theis, T.N.² Mooney, P.M.³ Wright, S.L.⁴

27
- 0021479989
- See, e.g. JJPYA5 0021-4922
- (1983) Jpn. J. Appl. Phys. , vol.23 , pp. L654
- Baba, T.¹ Mizutani, T.² Ogawa, M.³ Ohata, K.⁴

28
- 84914905845
- IPHSAC 0305-2346
- (1987) Inst. Phys. Conf. Ser. , vol.83 , pp. 563
- Heuken, M.¹ Prost, W.² Kugler, S.³ Heime, K.⁴

29
- 84948388504
- Washington, DC, December 6–9
- (1987) Proceedings of the IEDM , pp. 70
- Kiehl, R.A.¹ Frank, D.J.² Wright, S.L.³ Magerlein, H.J.⁴

30
- 0022243514
- See, e.g., IPHSAC 0305-2346
- (1985) Inst. Phys. Conf. Ser. , vol.74 , pp. 551
- Hida, H.¹ Miyamoto, H.² Ohata, K.³ Itoh, T.⁴ Baba, T.⁵ Ogawa, M.⁶

31
- 84948388555
- IPHSAC 0305-2346
- (1987) Inst. Phys. Conf. Ser. , vol.83 , pp. 581
- Chen, Y.K.¹ Radulescu, D.C.² Tasker, P.J.³ Wang, G.W.⁴ Eastman, L.F.⁵

32
- 0023010116
- See, e.g., IPHSAC 0305-2346
- (1986) Inst. Phys. Conf. Ser. , vol.79 , pp. 571
- Itoh, T.¹ Brown, A.S.² Camnitz, L.H.³ Wicks, G.W.⁴ Berry, J.D.⁵ Eastman, L.F.⁶

33
- 84917867449
- IPHSAC 0305-2346
- (1987) Inst. Phys. Conf. Ser. , vol.83 , pp. 569
- Okamoto, A.¹ Toyoshima, H.² Ohata, K.³

34
- 0040649364
- JAPIAU 0021-8979
- (1987) J. Appl. Phys. , vol.62 , pp. 3234
- Nathan, M.I.¹ Tiwari, S.² Mooney, P.M.³ Wright, S.L.⁴

35
- 0020732747
- JVTBD9 0734-211X
- (1984) J. Vac. Sci. Technol. B , vol.2 , pp. 229
- Yamanaka, K.¹ Naritsuka, S.² Mannoh, M.³ Yuasa, T.⁴ Nomura, Y.⁵ Mihara, M.⁶ Ishii, M.⁷

36
- 0342939859
- JAPIAU 0021-8979
- (1985) J. Appl. Phys. , vol.57 , pp. 1928
- Mooney, P.M.¹ Fischer, R.² Morkoç, H.³

37
- 0041422028
- IPHSAC 0305-2346
- (1987) Inst. Phys. Conf. Ser. , vol.83 , pp. 105
- Watanabe, M.O.¹ Ahizawa, Y.² Sugiyama, N.³ Nakanisi, T.⁴

38
- 30244540890
- IPHSAC 0305-2346
- (1979) Inst. Phys. Conf. Ser. , vol.46 , pp. 427
- Petroff, P.M.¹ Lang, D.V.² Logan, R.A.³ Johnston, D.W.⁴

39
- 0017631852
- ARMSCX 0084-6600
- (1977) Ann. Rev. Mater. Sci. , vol.7 , pp. 377
- Miller, G.L.¹ Lang, D.V.² Kimerling, L.C.³

40
- 0016510879
- JAPIAU 0021-8979
- (1975) J. Appl. Phys. , vol.46 , pp. 2155
- Grimmeiss, H.G.¹ Ledebo, L.-Å.²

41
- 84956260401
- JJPYA5 0021-4922
- (1982) Jpn. J. Appl. Phys. , vol.21 , pp. L476
- Ishibashi, T.¹ Tarucha, S.² Okamoto, H.³

42
- 0020203750
- JJPYA5 0021-4922
- (1982) Jpn. J. Appl. Phys. , vol.21 , pp. L675
- Ishikawa, T.¹ Saito, J.² Sasa, S.³ Hiyamizu, S.⁴

43
- 0020829254
- APSFDB 0721-7250
- (1983) Appl. Phys. A , vol.32 , pp. 69
- Künzel, H.¹ Fischer, A.² Knecht, J.³ Ploog, K.⁴

44
- 0021390844
- JECMA5 0361-5235
- (1984) J. Electron. Mater. , vol.13 , pp. 281
- Künzel, H.¹ Ploog, K.² Wünstel, K.³ Zhou, B.L.⁴

45
- 84948388495
- JJPYA5 0021-4922
- (1982) Jpn. J. Appl. Phys. , vol.21 , pp. L675
- Watanabe, M.O.¹ Maeda, H.²

46
- 0000333789
- (1984) Phys. Rev. , vol.30 , pp. 7021
- Schubert, E.F.¹ Ploog, K.²

47
- 0002391675
- APPLAB 0003-6951
- (1988) Appl. Phys. Lett. , vol.52 , pp. 383
- Calleja, E.¹ Gomez, A.² Muñoz, E.³

48
- 5644279817
- edited by G. Ferenczi (Trans. Tech, Switzerland)
- (1989) Defects in Semiconductors 15 , pp. 857
- Azema, S.¹ Mosser, V.² Camassel, J.³ Piotrzkowski, R.⁴ Robert, J.L.⁵ Gibart, P.⁶ Contour, J.P.⁷ Massié, J.⁸ Marty, A.⁹

49
- 0016470383
- JECMA5 0361-5235
- (1975) J. Electron. Mater. , vol.4 , pp. 101
- Spring Thorpe, A.J.¹ King, F.D.² Becke, A.³

50
- 36749121577
- APPLAB 0003-6951
- (1977) Appl. Phys. Lett. , vol.31 , pp. 351
- Nelson, R.J.¹

51
- 0019077497
- JAPIAU 0021-8979
- (1980) J. Appl. Phys. , vol.51 , pp. 5434
- Wagner, E.E.¹ Mars, D.E.² Hom, G.³ Stringfellow, G.B.⁴

52
- 3242844081
- JCRGAE 0022-0248
- (1986) J. Cryst. Growth , vol.77 , pp. 272
- Houng, Y.M.¹ Low, T.S.²

53
- 0000568120
- PRBMDO 0163-1829
- (1980) Phys. Rev. B , vol.21 , pp. 670
- Lifshitz, N.¹ Jarayaman, A.² Logan, R.A.³

54
- 0344835591
- JPSOAW 0022-3719
- (1980) J. Phys. C , vol.13 , pp. 4323
- Saxena, A.K.¹

55
- 36749111685
- APPLAB 0003-6951
- (1980) Appl. Phys. Lett. , vol.36 , pp. 79
- Saxena, A.K.¹

56
- 0019575311
- PSSBBD 0370-1972
- (1981) Phys. Status Solidi B , vol.105 , pp. 777
- Saxena, A.K.¹

57
- 0020088064
- SSELA5 0038-1101
- (1982) Solid State Electron. , vol.25 , pp. 127
- Saxena, A.K.¹

58
- 0022028880
- APSFDB 0721-7250
- (1985) Appl. Phys. A , vol.36 , pp. 147
- Briones, F.¹ Golmayo, D.² González, L.³

59
- 84948388594
- APPLAB 0003-6951
- (1988) Appl. Phys. Lett. , vol.53 , pp. 749
- Li, M.F.¹ Shan, W.² Yu, P.Y.³ Hansen, W.L.⁴ Weber, E.R.⁵ Bauser, E.⁶

60
- 3643106608
- IPHSAC 0305-2346
- (1988) Inst. Phys. Conf. Ser. , vol.91 , pp. 223
- Basmaji, P.¹ Portal, J.C.² Aulombard, R.L.³ Fan, C.⁴ Maude, D.K.⁵ Eaves, L.⁶ Gibart, P.⁷

61
- 0021376990
- JJPYA5 0021-4922
- (1984) Jpn. J. Appl. Phys. , vol.23 , pp. L103
- Watanabe, M.O.¹ Morizuka, K.² Mashita, M.³ Ashizawa, Y.⁴ Zota, Y.⁵

62
- 0039849643
- IPHSAC 0305-2346
- (1984) Inst. Phys. Conf. Ser. , vol.74 , pp. 241
- Theis, T.N.¹ Kuech, T.F.² Palmateer, L.F.³ Mooney, P.M.⁴

63
- 0347286161
- IPHSAC 0305-2346
- (1989) Inst. Phys. Conf. Ser. , vol.95 , pp. 307
- Theis, T.N.¹

64
- 36549092433
- APPLAB 0003-6951
- (1988) Appl. Phys. Lett. , vol.48 , pp. 1144
- Drummond, T.J.¹ Hjalmarson, H.P.²

65
- 0041431294
- PRBMDO 0163-1829
- (1988) Phys. Rev. B , vol.37 , pp. 1043
- Mizuta, M.¹ Mori, K.²

66
- 0342381443
- PRBMDO 0163-1829
- (1988) Phys. Rev. B , vol.38 , pp. 3276
- Dmochowski, J.E.¹ Langer, J.M.² Raczńska, J.³ Jantsch, W.⁴

67
- 84936690703
- IPHSAC 0305-2346
- (1989) Inst. Phys. Conf. Ser. , vol.95 , pp. 325
- Bmochowski, J.E.¹ Langer, J.M.² Jantsch, W.³

68
- 4243480488
- JPSOAW 0022-3719
- (1984) J. Phys. C , vol.17 , pp. L915
- Kenning, J.C.M.¹ Ansems, J.P.M.² Nijs, A.G.M.³

69
- 0010475320
- SSTEET 0268-1242
- (1988) Semicond. Sci. Technol. , vol.3 , pp. 361
- Henning, J.C.M.¹ Ansems, J.P.M.² Roksnoer, P.J.³

70
- 3643065774
- PRLTAO 0031-9007
- (1989) Phys. Rev. Lett. , vol.63 , pp. 2276
- Brunthaler, G.¹ Ploog, K.² Jantsch, W.³

71
- 0021664124
- JJPYA5 0021-4922
- (1984) Jpn. J. Appl. Phys. , vol.23 , pp. 1594
- Tachikawa, M.¹ Mizuta, M.² Kukimoto, H.³

72
- 84950768955
- edited by H.J. von Bardeleben, Materials Science Forum 10–12 (Trans. Tech, Switzerland)
- (1986) Defects in Semiconductors , pp. 417
- Mooney, P.M.¹ Calleja, E.² Wright, S.L.³ Heiblum, M.⁴

73
- 0021606046
- APPLAB 0003-6951
- (1984) Appl. Phys. Lett. , vol.45 , pp. 1322
- Kumagi, O.¹ Kawai, H.² Mori, Y.³ Kaneko, K.⁴

74
- 0020167971
- APSFDB 0721-7250
- (1982) Appl. Phys. A , vol.28 , pp. 223
- Zhou, B.L.¹ Ploog, K.² Gemlin, E.³ Zheng, X.O.⁴ Schultz, M.⁵

75
- 84951222717
- JVTBD9 0734-211X
- (1985) J. Vac. Sci. Technol. B , vol.3 , pp. 943
- Ohno, H.¹ Akatsu, Y.² Hashizume, T.³ Hasegawa, H.⁴ Sano, N.⁵ Kato, H.⁶ Nakayama, M.⁷

76
- 0022685870
- IETDAI 0018-9383
- (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 698
- Dhar, S.¹ Hong, W.-P.² Bhattacharya, P.K.³ Nashimoto, Y.⁴ Juang, F.-Y.⁵

77
- 84950601745
- edited by H.J. von Bardeleben, Materials Science Forum 10–12 (Trans. Tech, Switzerland)
- (1986) Defects in Semiconductors , pp. 405
- Subramian, S.¹ Arora, B.M.² Mahopatra, Y.N.³ Kumar, V.⁴

78
- 11544288230
- edited by M. Stavola, S.J. Pearton, and G. Davies (Materials Research Society, Pittsburgh, PA)
- (1988) Defects in Electronic Materials , pp. 585
- Farmer, J.W.¹ Hjalmarson, H.P.² Samara, G.A.³

79
- 0021156713
- JJPYA5 0021-4922
- (1984) Jpn. J. Appl. Phys. , vol.23 , pp. L29
- Yoshino, J.¹ Tachikawa, M.² Matsuda, N.³ Mizuta, M.⁴ Kukimoto, H.⁵

80
- 0023399178
- JPSOAW 0022-3719
- (1987) J. Phys. C , vol.20 , pp. 3603
- Diwan, A.¹ Singh, V.A.² Arora, B.M.³ Murawala, P.A.⁴

81
- 0020826188
- JAPIAU 0021-8979
- (1984) J. Appl. Phys. , vol.54 , pp. 5117
- Omlimg, P.¹ Samuelson, L.² Grimmeiss, H.G.³

82
- 0000609857
- APPLAB 0003-6951
- (1988) Appl. Phys. Lett. , vol.52 , pp. 660
- Criado, J.¹ Gomez, A.² Calleja, E.³ Muñoz, E.⁴

83
- 0022496229
- SSELA5 0038-1101
- (1986) Solid-State Electron. , vol.29 , pp. 83
- Calleja, E.¹ Gomez, A.I.² Muñoz, E.³

84
- 0001341076
- APPLAB 0003-6951
- (1986) Appl. Phys. Lett. , vol.49 , pp. 1790
- Criado, J.¹ Gomez, A.² Muñoz, E.³ Calleja, E.⁴

85
- 84948388499
- edited by H.J. von Bardeleben, Materials Science Forum 10–12 (Trans. Tech, Switzerland)
- (1986) Defects in Semiconductors , pp. 411
- Muñoz, E.¹ Gomez, A.² Calleja, E.³ Criado, J.J.⁴ Herrero, J.M.⁵ Sandoval, F.⁶

86
- 0041470714
- APPLAB 0003-6951
- (1986) Appl. Phys. Lett. , vol.49 , pp. 657
- Calleja, E.¹ Mooney, P.M.² Wright, S.L.³ Heiblum, M.⁴

87
- 0022025459
- JJPYA5 0021-4922
- (1985) Jpn. J. Appl. Phys. , vol.24 , pp. 303
- Takikawa, M.¹ Ozeki, M.²

88
- 84950876500
- edited by H.J. von Bardeleben, Materials Science Forum 10–12 (Trans. Tech, Switzerland)
- (1986) Defects in Semiconductors , pp. 399
- Dobaczewski, L.¹ Langer, J.M.²

89
- 36549096779
- APPLAB 0003-6951
- (1988) Appl. Phys. Lett. , vol.52 , pp. 1877
- Calleja, E.¹ Gomez, A.² Muñoz, E.³ Cámara, P.⁴

90
- 0022231818
- IPHSAC 0305-2346
- (1985) Inst. Phys. Conf. Ser. , vol.74 , pp. 617
- Mooney, P.¹ Solomon, P.M.² Theis, T.N.³

91
- 0022284949
- MRSPDH 0272-9172
- (1985) Mater. Res. Soc. Symp. Proc. , vol.46 , pp. 403
- Mooney, P.M.¹ Caswell, N.S.² Wright, S.L.³

92
- 0039017334
- APPLAB 0003-6951
- (1986) Appl. Phys. Lett. , vol.48 , pp. 1093
- Caswell, N.S.¹ Mooney, P.M.² Wright, S.L.³ Solomon, P.M.⁴

93
- 0020115485
- JVTBD9 0734-211X
- (1983) J. Vac. Sci. Technol. B , vol.1 , pp. 190
- Valois, A.J.¹ Robinson, G.Y.² Lee, K.³ Shur, M.S.⁴

94
- 0001577844
- edited by S.T. Pantelides (Gordon and Breach, New York)
- (1986) Deep Centers in Semiconductors , pp. 489
- Lang, D.V.¹

95
- 84948388442
- edited by O. Engström (World Scientific, Singapore)
- (1987) Proceedings of the 18th Conference on the Physics of Semiconductors , vol.2 , pp. 927
- Theis, T.N.¹ Parker, B.² Solomon, P.M.³ Wright, S.L.⁴

96
- 84926850551
- IPHSAC 0305-2346
- (1988) Inst. Phys. Conf. Ser. , vol.91 , pp. 1
- Theis, T.N.¹

97
- 84948388561
- edited by W. Zawadzki (Institute of Physics of the Polish Academy of Science, Warsaw)
- (1988) the 19th International Conference on the Physics of Semiconductors , pp. 1083
- Theis, T.N.¹

98
- 84957283380
- (unpublished).
- Muñoz, E.¹ Calleja, E.² Majerfield, A.³

99
- 0018322504
- IPHSAC 0305-2346
- (1979) Inst. Phys. Conf. Ser. , vol.43 , pp. 433
- Lang, D.V.¹ Logan, R.A.²

100
- 0342555470
- PRBMDO 0163-1829
- (1979) Phys. Rev. B , vol.20 , pp. 654
- Mertz, J.L.¹ van der Ziel, J.P.² Logan, R.A.³

101
- 0039854898
- PRBMDO 0163-1829
- (1987) Phys. Rev. B , vol.35 , pp. 7505
- Legros, R.¹ Mooney, P.M.² Wright, S.L.³

102
- 84954068760
- edited by H. Kukimoto and S. Miyazawa (Ohmsha, Tokyo)
- (1986) Semi-insulating III-V Materials , pp. 543
- Ledebo, L.-Å.¹

103
- 0023454802
- APSFDB 0721-7250
- (1987) Appl. Phys. A , vol.44 , pp. 245
- Henning, J.C.M.¹ Ansems, J.P.M.²

104
- 0001991639
- PRBMDO 0163-1829
- (1988) Phys. Rev. B , vol.37 , pp. 8298
- Mooney, P.M.¹ Northrop, G.A.² Morgan, T.N.³ Grimmeiss, H.G.⁴

105
- 0642374739
- PRBMDO 0163-1829
- (1988) Phys. Rev. B , vol.38 , pp. 5772
- Henning, J.C.M.¹ Ansems, J.P.M.²

106
- 36549095552
- APPLAB 0003-6951
- (1987) Appl. Phys. Lett. , vol.51 , pp. 1358
- Talwar, D.N.¹ Manasreh, M.O.² Suh, K.S.³ Covington, B.C.⁴

107
- 0022147815
- JJPYA5 0021-4922
- (1985) Jpn. J. Appl. Phys. , vol.24 , pp. L883
- Ashizawa, Y.¹ Watanabe, M.O.²

108
- 84990668514
- PSSABA 0031-8965
- (1987) Phys. Status Solidi A , vol.100 , pp. K41
- Basmaji, P.¹ Guittard, M.² Gibart, P.³

109
- 36549103776
- APPLAB 0003-6951
- (1988) Appl. Phys. Lett. , vol.52 , pp. 1237
- Etienne, B.¹ Theiry-Mieg, V.²

110
- 84950827295
- edited by H.J. von Bardeleben, Materials Science Forum 10–12 (Trans. Tech, Switzerland)
- (1986) Defects in Semiconductors , pp. 393
- Theis, T.N.¹

111
- 0022013506
- JJPYA5 0021-4922
- (1985) Jpn. J. Appl. Phys. , vol.24 , pp. L143
- Mizuta, M.¹ Tachikawa, M.² Kukimoto, H.³ Minomura, S.⁴

112
- 0022149323
- JJPYA5 0021-4922
- (1985) Jpn. J. Appl. Phys. , vol.24 , pp. L893
- Tachikawa, M.¹ Fujisawa, T.² Kukimoto, H.³ Oomi, G.⁴ Minomura, S.⁵

113
- 0022144689
- JJPYA5 0021-4922
- (1985) Jpn. J. Appl. Phys. , vol.24 , pp. L821
- Tachikawa, M.¹ Mizuta, M.² Kukimoto, H.³ Minomura, S.⁴

114
- 0024126365
- JJPYA5 0021-4922
- (1988) Jpn. J. Appl. Phys. , vol.27 , pp. L2373
- Fujisawa, T.¹ Kristofik, J.² Yoshino, J.³ Kukimoto, H.⁴

115
- 4243106628
- APPLAB 0003-6951
- (1987) Appl. Phys. Lett. , vol.51 , pp. 349
- Li, M.F.¹ Yu, P.Y.² Weber, E.R.³ Hansen, W.⁴

116
- 84953847028
- SSCOA4 0038-1098
- (1987) Solid State Commun. , vol.61 , pp. 13
- Li, M.F.¹ Yu, P.Y.²

117
- 84927373953
- edited by M. Stavoia, S.J. Pearton, and G. Davies (Materials Research Society, Pittsburgh PA)
- (1988) Defects in Electronic Materials , pp. 573
- Li, M.F.¹ Shan, W.² Yu, P.Y.³ Hansen, W.L.⁴ Weber, E.R.⁵ Bauser, E.⁶

118
- 0345890705
- PRBMDO 0163-1829
- (1987) Phys. Rev. B , vol.36 , pp. 4531
- Li, M.F.¹ Yu, P.Y.² Weber, E.R.³ Hansen, W.⁴

119
- 0007023006
- APPLAB 0003-6951
- (1989) Appl. Phys. Lett. , vol.53 , pp. 2546
- Mooney, P.M.¹ Theis, T.N.² Wright, S.L.³

120
- 84921156560
- edited by G. Ferenczi (Trans. Tech, Switzerland)
- (1989) Defects in Semiconductors 15 , pp. 1109

121
- 0022738761
- JJPYA5 0021-4922
- (1986) Jpn. J. Appl. Phys. , vol.25 , pp. L484
- Ishikawa, T.¹ Yamamoio, T.² Kondo, K.³

122
- 24644497264
- IPHSAC 0305-2346
- (1987) Inst. Phys. Conf. Ser. , vol.83 , pp. 99
- Ishikawa, T.¹ Yamamoto, T.² Kondo, K.³ Komeno, J.⁴ Shibatomi, A.⁵

123
- 84948388629
- IPHSAC 0305-2346
- (1988) Inst. Phys. Conf. Ser. , vol.91 , pp. 351
- Ishikawa, T.¹ Kondo, K.²

124
- 0001084324
- PRLTAO 0031-9007
- (1988) Phys. Rev. Lett. , vol.60 , pp. 361
- Theis, T.N.¹ Mooney, P.M.² Wright, S.L.³

125
- 33845447189
- IPHSAC 0305-2346
- (1988) Inst. Phys. Conf. Ser. , vol.91 , pp. 359
- Mooney, P.M.¹ Theis, T.N.² Wright, S.L.³

126
- 3643147228
- PRLTAO 0031-9007
- (1987) Phys. Rev. Lett. , vol.59 , pp. 815
- Maude, D.K.¹ Portal, J.C.² Dmowski, L.³ Foster, T.⁴ Eaves, L.⁵ Nathan, M.⁶ Heiblum, M.⁷ Harris, J.J.⁸ Beall, R.B.⁹

127
- 84918175422
- IPHSAC 0305-2346
- (1988) Inst. Phys. Conf. Ser. , vol.91 , pp. 355
- Eaves, L.¹ Foster, T.J.² Maude, D.K.³ Toombs, G.A.⁴ Murray, R.⁵ Newman, R.C.⁶ Portal, J.C.⁷ Dmowski, L.⁸ Beall, R.B.⁹ Harris, J.J.¹⁰ Nathan, M.I.¹¹ Heiblum, M.¹²

128
- 84918180438
- IPHSAC 0305-2346
- (1989) Inst. Phys. Conf. Ser. , vol.95 , pp. 315
- Eaves, L.¹ Foster, T.J.² Maude, D.K.³ Portal, J.C.⁴ Murray, R.⁵ Newman, R.C.⁶ Dmowski, L.⁷ Beall, R.B.⁸ Harris, J.J.⁹ Nathan, M.I.¹⁰ Heiblum, M.¹¹

129
- 0018531189
- JAPIAU 0021-8979
- (1979) J. Appl. Phys. , vol.50 , pp. 6334
- Craven, R.A.¹ Finn, D.²

130
- 0020114359
- SSELA5 0038-1101
- (1982) Solid State Electron. , vol.25 , pp. 325
- Henning, I.D.¹ Thomas, H.²

131
- 2842608877
- APPLAB 0003-6951
- (1983) Appl. Phys. Lett. , vol.42 , pp. 528
- Calleja, E.¹ Muñoz, E.² Garcia, F.³

132
- 36549090810
- JAPIAU 0021-8979
- (1985) J. Appl. Phys. , vol.57 , pp. 5295
- Calleja, E.¹ Muñoz, E.² Jimenez, B.³ Gomez, A.⁴ Garcia, F.⁵ Kellert, F.⁶

133
- 0022013932
- SSCOA4 0038-1098
- (1985) Solid State Commun. , vol.53 , pp. 485
- Kaniewska, M.¹ Kaniewski, J.²

134
- 0039319306
- JAPIAU 0021-8979
- (1988) J. Appl. Phys. , vol.63 , pp. 1086
- Kaniewska, M.¹ Kaniewski, J.²

135
- 0022674148
- JJPYA5 0021-4922
- (1986) Jpn. J. Appl. Phys. , vol.25 , pp. L191
- Kitahara, K.¹ Hoshino, M.² Kodama, K.³ Ozeki, M.⁴

136
- 84953823153
- JJPYA5 0021-4922
- (1986) Jpn. J. Appl. Phys. , vol.25 , pp. L534
- Kitahara, K.¹ Hoshino, M.² Kodama, K.³ Ozeki, M.⁴

137
- 11744301304
- JAPIAU 0021-8979
- (1986) J. Appl. Phys. , vol.60 , pp. 1032
- Watanabe, M.O.¹ Ohba, Y.²

138
- 0001233095
- JAPIAU 0021-8979
- (1986) J. Appl. Phys. , vol.59 , pp. 3489
- Nojima, S.¹ Tanaka, H.² Asahi, H.³

139
- 84990634579
- PSSABA 0031-8965
- (1987) Phys. Status Solidi A , vol.103 , pp. 511
- Nakashima, K.¹ Nijima, S.² Kawamura, Y.³ Asahi, H.⁴

140
- 0023385066
- JECMA5 0361-5235
- (1987) J. Electron. Mater. , vol.16 , pp. 271
- Hong, W.-P.¹ Dhar, S.² Bhattacharya, P.K.³ Chin, A.⁴

141
- 36549100277
- APPLAB 0003-6951
- (1986) Appl. Phys. Lett. , vol.48 , pp. 997
- Stavola, M.¹ Capasso, F.² Nabity, J.C.³ Alavi, K.⁴ Cho, A.Y.⁵

142
- 4243799441
- PHBCDQ 0378-4363
- (1983) Physica , vol.117B & 118B , pp. 92
- Konczewicz, L.¹ Litwin-Stazewska, E.² Porowski, S.³ Iller, A.⁴ Aulombard, R.L.⁵ Robert, J.L.⁶ Joullié, A.⁷

143
- 0040881514
- IPHSAC 0305-2346
- (1987) Inst. Phys. Conf. Ser. , vol.83 , pp. 203
- Takeda, Y.¹ Zhu, Y.² Sasaki, A.³

144
- 0023329806
- JJPYA5 0021-4922
- (1987) Jpn. J. Appl. Phys. , vol.26 , pp. L273
- Takeda, Y.¹ Gong, X.C.² Zhu, Y.³ Sasaki, A.⁴

145
- 84916187124
- IPHSAC 0305-2346
- (1988) Inst. Phys. Conf. Ser. , vol.91 , pp. 243
- Takeda, Y.¹ Zhu, Y.² Sasaki, A.³

146
- 0040144658
- JUPSAU 0031-9015
- (1980) J. Phys. Soc. Jpn. , vol.49 , pp. 207
- Langer, J.M.¹

147
- 84927880609
- edited by F. Beleznay, G. Ferenczi, and J. Giber, Lecture Notes in Physics No. 122 (Springer, Berlin)
- (1980) New Developments in Semiconductor Physics , pp. 123
- Langer, J.M.¹

148
- 4243541791
- PRLTAO 0031-9007
- (1979) Phys. Rev. Lett. , vol.43 , pp. 1536
- Narayanamurti, V.¹ Logan, R.A.² Chin, M.A.³

149
- 84948388543
- edited by O. Engstrom (World Scientific, Singapore)
- (1987) Proceedings of the 18th International Conference on the Physics of Semiconductors , vol.2 , pp. 923
- Morgan, T.N.¹

150
- 0023023652
- IPHSAC 0305-2346
- (1986) Inst. Phys. Conf. Ser. , vol.79 , pp. 271
- Noge, H.¹ Ikoma, T.²

151
- 84948388497
- edited by M. Stavola, S.J. Pearton, and G. Davies (Materials Research Society, Pittsburgh, PA)
- (1988) Defects in Electronic Materials , pp. 543
- Murray, R.¹ Newman, R.C.² Nandhra, P.S.³ Beall, R.B.⁴ Harris, J.J.⁵ Wright, P.J.⁶

152
- 36549099633
- JAPIAU 0021-8979
- (1986) J. Appl. Phys. , vol.60 , pp. 3466
- Williamson, D.L.¹

153
- 36549095954
- JAPIAU 0021-8979
- (1987) J. Appl. Phys. , vol.62 , pp. 1739
- Williamson, D.L.¹ Gibart, P.² El Jani, B.³ N'Guessan, K.⁴

154
- 84948388482
- IPHSAC 0305-2346
- (1988) Inst. Phys. Conf. Ser. , vol.91 , pp. 379
- Gibart, P.¹ Williamson, D.L.² El Jani, B.³ Basmaji, P.⁴

155
- 84934886623
- (Materials Research Society, Pittsburgh, PA)
- (1988) Defects in Electronic Materials , pp. 527
- Langouche, G.¹ Schroyen, D.² Bemelmans, H.³ Van Rossum, M.⁴ Deraedt, W.⁵ de Potter, M.⁶

156
- 4243803692
- PRLTAO 0031-9007
- (1986) Phys. Rev. Lett. , vol.56 , pp. 2637
- Sette, F.¹ Pearton, S.J.² Poate, J.M.³ Rowe, J.E.⁴

157
- 84948388459
- edited by M. Stavola, S.J. Pearton, and G. Davies (Materials Research Society, Pittsburgh, PA)
- (1988) Defects in Electronic Materials , pp. 515
- Sette, F.¹ Pearton, S.J.² Poate, J.M.³ Rowe, J.E.⁴

158
- 0023456009
- JJPYA5 0021-4922
- (1987) Jpn. J. Appl. Phys. , vol.26 , pp. L1806
- Kitano, T.¹ Mizuta, M.²

159
- 36549104546
- APPLAB 0003-6951
- (1988) Appl. Phys. Lett. , vol.52 , pp. 126
- Mizuta, M.¹ Kitano, T.²

160
- 84983846189
- PSSBBD 0370-1972
- (1973) Phys. Status Solidi B , vol.58 , pp. K23
- Böttcher, R.¹ Wartewig, S.² Bindemann, R.³ Kühn, G.⁴

161
- 84987070637
- PSSBBD 0370-1972
- (1975) Phys. Status Solidi B , vol.70 , pp. K23
- Wartewig, S.¹ Böttcher, R.² Kühn, G.³

162
- 84927284715
- edited by G. Ferenczi (Trans. Tech, Switzerland)
- (1989) Defects in Semiconductors 15 , pp. 1067
- Khachaturyan, K.A.¹ Weber, E.R.²

163
- 0542422440
- PRBMDO 0163-1829
- (1989) Phys. Rev. B , vol.39 , pp. 5554
- Mooney, P.M.¹ Wilkening, W.² Kaufmann, U.³ Kuech, T.F.⁴

164
- 84957278797
- (unpublished).
- von Bardeleben, H.J.¹ Bourgoin, J.C.²

165
- 84871281164
- JPSOAW 0022-3719
- (1988) J. Phys. C , vol.21 , pp. L311
- Montie, E.A.¹ Henning, J.C.M.²

166
- 84927810377
- edited by G. Ferenczi (Materials Research Society, Pittsburgh, PA)
- (1988) Defects in Electronic Materials , pp. 555
- Kennedy, T.A.¹ Magno, R.² Glaser, E.³ Spencer, M.G.⁴

167
- 33749090531
- IPHSAC 0305-2346
- (1989) Inst. Phys. Conf. Ser. , vol.95 , pp. 233
- Glaser, E.¹ Kennedy, T.A.² Molnar, B.³

168
- 1542698970
- PRBMDO 0163-1829
- (1989) Phys. Rev. B , vol.40 , pp. 3447
- Glaser, E.¹ Kennedy, T.A.² Sillmon, R.S.³ Spenser, M.G.⁴

169
- 84927371301
- edited by G. Ferenczi (Trans. Tech, Switzerland)
- (1989) Defects in Semiconductors 15 , pp. 1079
- Morgan, T.N.¹

170
- 0024680176
- JJPYA5 0021-4922
- (1989) Jpn. J. Appl. Phys. , vol.28 , pp. L891
- Baba, T.¹ Mizuta, M.² Fujisawa, T.³ Yoshino, J.⁴ Kukimoto, H.⁵

171
- 0344024293
- JAPIAU 0021-8979
- (1989) J. Appl. Phys. , vol.66 , pp. 3042
- Kasu, M.¹ Fujita, S.² Sasaki, A.³

172
- 0022217185
- San Francisco, 1984, edited by J.D. Chadi and W.A. Harrison (Springer, New York)
- (1985) Proceedings of the 17th International Conference on the Physics of Semiconductors , pp. 1303
- Queisser, H.J.¹

173
- 0020831731
- JJPYA5 0021-4922
- (1983) Jpn. J. Appl. Phys. , vol.22 , pp. L627
- Baba, T.¹ Mizutani, T.² Ogawa, M.³

174
- 0023133676
- SSTEET 0268-1242
- (1987) Semicond. Sci. Technol. , vol.2 , pp. 1
- Henning, J.C.M.¹ Ansems, J.P.M.²

175
- 1542555205
- APPLAB 0003-6951
- (1986) Appl. Phys. Lett. , vol.48 , pp. 656
- Hjalmarson, H.P.¹ Drummond, T.J.²

176
- 4243152377
- PRLTAO 0031-9007
- (1988) Phys. Rev. Lett. , vol.60 , pp. 2410
- Hjalmarson, H.P.¹ Drummond, T.J.²

177
- 0022759836
- JJPYA5 0021-4922
- (1986) Jpn. J. Appl. Phys. , vol.25 , pp. L643
- Yamaguchi, E.¹

178
- 0040449541
- JUPSAU 0031-9015
- (1987) J. Phys. Soc. Jpn. , vol.56 , pp. 2835
- Yamaguchi, E.¹

179
- 36549100570
- APPLAB 0003-6951
- (1988) Appl. Phys. Lett. , vol.53 , pp. 749
- Bourgoin, J.C.¹ Mauger, A.²

180
- 35949010294
- and references therein. PRBMDO 0163-1829
- (1987) Phys. Rev. B , vol.36 , pp. 2741
- Resca, L.¹ Lohrmann, D.J.² Graft, R.D.³

181
- 0022217929
- JJPYA5 0021-4922
- (1985) Jpn. J. Appl. Phys. , vol.24 , pp. L928
- Kobayashi, K.L.I.¹ Uchida, Y.² Nakashima, H.³

182
- 0022955483
- IPHSAC 0305-2346
- (1986) Inst. Phys. Conf. Ser. , vol.79 , pp. 265
- Uchida, Y.¹ Kobayashi, K.L.I.² Nakashima, H.³

183
- 35949017292
- PRBMDO 0163-1829
- (1986) Phys. Rev. B , vol.33 , pp. 4320
- Oshiyama, A.¹ Ohnishi, S.²

184
- 84948388668
- IPHSAC 0305-2346
- (1989) Inst. Phys. Conf. Ser. , vol.95 , pp. 335
- Oshiyami, A.¹

185
- 0041947663
- PRBMDO 0163-1829
- (1986) Phys. Rev. B , vol.43 , pp. 2664
- Morgan, T.N.¹

186
- 4243373450
- PRLTAO 0031-9007
- (1988) Phys. Rev. Lett. , vol.61 , pp. 873
- Chadi, D.J.¹ Chang, K.J.²

187
- 0000014457
- PRBMDO 0163-1829
- (1989) Phys. Rev. B , vol.39 , pp. 10366
- Chadi, D.J.¹ Chang, K.J.²

188
- 33646652949
- PRLTAO 0031-9007
- (1988) Phys. Rev. Lett. , vol.60 , pp. 2183
- Schefler, M.¹

189
- 3643137824
- PRLTAO 0031-9007
- (1989) Phys. Rev. Lett. , vol.62 , pp. 1922
- Maude, D.K.¹ Eaves, L.² Foster, T.J.³ Portal, J.C.⁴

190
- 33747594875
- PRLTAO 0031-9007
- (1989) Phys. Rev. Lett. , vol.62 , pp. 1923
- Chadi, D.J.¹ Chang, K.J.² Walukiewicz, W.³

191
- 0040488760
- APPLAB 0003-6951
- (1989) Appl. Phys. Lett. , vol.55 , pp. 1409
- O'Reilly, E.P.¹

192
- 84957279076
- (unpublished).
- Dietle, T.¹ Dmochowski, J.E.² Kossut, J.³ Langer, J.M.⁴ Swiatek, K.⁵

193
- 84957272544
- (unpublished).
- Theis, T.N.¹ Parker, B.D.²

194
- 84957272443
- (unpublished).
- Dobaczewski, L.¹ Dmochowski, J.E.² Langer, J.M.³

195
- 84957277736
- G.E. Stillman(unpublished).
- Khachaturyan, K.¹ Weber, E.R.² Craford, M.G.³

196
- 4243507339
- PRLTAO 0031-9007
- (1989) Phys. Rev. Lett. , vol.63 , pp. 1311
- Khachaturyan, K.A.¹ Awschalom, D.D.² Rosen, J.R.³ Weber, E.R.⁴

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