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Surface Science

Volumn 191, Issue 3, 1987, Pages 305-328

Thin epitaxial Ge−Si(111) films: Study and control of morphology

(5) Maree P M J a Nakagawa, K a Mulders, F M a van der Veen, J F a Kavanagh, K L b

a FOM INSTITUTE AMOLF (Netherlands)

b Department of Obstetrics Gynecology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84927272361 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(87)81180-9 Document Type: Article

Times cited : (155)

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