Advanced prior modeling for 3D bright field electron tomography

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 9401, Issue , 2015, Pages

  Sreehari, Suhas ^a   Venkatakrishnan, S V ^b   Drummy, Lawrence F ^c   Simmons, Jeffrey P ^c   Bouman, Charles A ^a  

^a PURDUE UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

3D tomography; bright field; Non local means; plug and play

Indexed keywords

ALGORITHMS; ALUMINUM; COST FUNCTIONS; ELECTRIC IMPEDANCE TOMOGRAPHY; IMAGE DENOISING; ITERATIVE METHODS; REDUNDANCY; TOMOGRAPHY;

3-D TOMOGRAPHIES; BRIGHT FIELDS; DE-NOISING ALGORITHM; MODEL BASED ITERATIVE RECONSTRUCTION; NON LOCAL MEANS; NON LOCAL MEANS (NLM); PLUG AND PLAY; TOMOGRAPHIC RECONSTRUCTION;

THREE DIMENSIONAL COMPUTER GRAPHICS;

EID: 84926623579     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2185603     Document Type: Conference Paper

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