Quantification and micron-scale imaging of spatial distribution of trace beryllium in shrapnel fragments and metallurgic samples with correlative fluorescence detection method and secondary ion mass spectrometry (SIMS)

Journal of Microscopy

Volumn 256, Issue 2, 2014, Pages 145-152

  Abraham, J L ^a   Chandra, S ^b   Agrawal, A ^c  

^a State University of New York Upstate Medical University: College of Medicine   (United States)

^b School of Operations Research and Industrial Engineering   (United States)

^c Berylliant Inc   (United States)

Author keywords

Beryllium analysis with fluorescence detection method; Beryllium in aluminum cans and foil; Beryllium in electronic products; Beryllium in shrapnel; Chronic beryllium disease (CBD); SIMS imaging analysis of beryllium in metallurgic samples

Indexed keywords

ALUMINUM ALLOYS; BINARY ALLOYS; BOTTLES; IONS; SECONDARY EMISSION; SPATIAL DISTRIBUTION; TRACE ELEMENTS;

ALUMINUM CAN; BERYLLIUM ANALYSE WITH FLUORESCENCE DETECTION METHOD; BERYLLIUM IN ALUMINUM CAN AND FOIL; BERYLLIUM IN ELECTRONIC PRODUCT; BERYLLIUM IN SHRAPNEL; CHRONIC BERYLLIUM DISEASE; DETECTION METHODS; ELECTRONICS PRODUCTS; FLUORESCENCE DETECTION; IMAGING ANALYSIS; MASS-SPECTROMETRY IMAGING; SECONDARY ION MASS SPECTROMETRY IMAGING ANALYSE OF BERYLLIUM IN METALLURGIC SAMPLE; SECONDARY ION-MASS SPECTROMETRY;

SECONDARY ION MASS SPECTROMETRY;

ALUMINUM; BERYLLIUM;

CHEMISTRY; DIAGNOSTIC IMAGING; FLUORESCENCE; FOOD PACKAGING; MASS SPECTROMETRY; PARTICLE SIZE; PROCEDURES;

ALUMINUM; BERYLLIUM; DIAGNOSTIC IMAGING; FLUORESCENCE; FOOD PACKAGING; PARTICLE SIZE; SPECTROMETRY, MASS, SECONDARY ION;

EID: 84926616439     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/jmi.12170     Document Type: Article

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