Study of structural and optoelectronic properties of Cu2Zn(Sn1 - XGex)Se4(x = 0 to 1) alloy compounds

Thin Solid Films

Volumn 582, Issue , 2015, Pages 176-179

  Grossberg, M ^a   Timmo, K ^a   Raadik, T ^a   Karber E ^a   Mikli, V ^a   Krustok, J ^a  

^a TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

Author keywords

Cu2Zn(Sn1 xGex); Kesterite; Photoluminescence; Raman scattering; Se4

Indexed keywords

CRYSTAL IMPURITIES; CRYSTAL SYMMETRY; GERMANIUM METALLOGRAPHY; LATTICE CONSTANTS; PHOTOLUMINESCENCE; PHOTOLUMINESCENCE SPECTROSCOPY; POLYCRYSTALS; RAMAN SCATTERING; TEMPERATURE; X RAY POWDER DIFFRACTION;

CU2ZN(SN1-XGEX); GE CONCENTRATIONS; KESTERITES; LOW TEMPERATURE PHOTOLUMINESCENCE SPECTROSCOPIES; OPTOELECTRONIC PROPERTIES; RADIATIVE RECOMBINATION PROCESS; RECOMBINATION MECHANISMS; TEMPERATURE DEPENDENT;

GERMANIUM;

EID: 84926456097     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2014.10.055     Document Type: Conference Paper

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