A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. I. methodology

Journal of Applied Crystallography

Volumn 21, Issue 5, 1988, Pages 536-542

  Enzo, S ^a   Fagherazzi, G ^a   Benedetti, A ^a   Polizzi, S ^a  

^a CA' FOSCARI UNIVERSITY OF VENICE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLITE SIZE; FOURIER ANALYSIS; QUARTZ; X RAY DIFFRACTION;

DIFFRACTION PROFILES; INSTRUMENTAL FUNCTION; LINE-BROADENING ANALYSIS; MICRO-STRUCTURAL PROPERTIES; MICROSTRUCTURAL FACTORS; PARAMETRIC FUNCTIONS; PHYSICAL INFORMATION; PSEUDO-VOIGT FUNCTIONS;

EXPONENTIAL FUNCTIONS;

EID: 84926111268     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889888006612     Document Type: Article

References (0)