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The Ethics of Technological Risk
Volumn , Issue , 2012, Pages 1-290
The ethics of technological risk
(2)
Asveld, Lotte
a
Roeser, Sabine
b
a
Rathenau Institute KNAW
(
Netherlands
)
b
DELFT UNIVERSITY OF TECHNOLOGY
(
Netherlands
)
Author keywords
[No Author keywords available]
Indexed keywords
EID
:
84925729119
PISSN
:
None
EISSN
:
None
Source Type
:
Book
DOI
:
10.4324/9781849772990
Document Type
:
Book
Times cited : (
3
)
References (
0
)
Reference 정보가 존재하지 않습니다.
* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.