Improved PLS focused on key-performance-indicator-related fault diagnosis

IEEE Transactions on Industrial Electronics

Volumn 62, Issue 3, 2015, Pages 1651-1658

  Yin, Shen ^a,b   Zhu, Xiangping ^a,b   Kaynak, Okyay ^c  

^a BOHAI UNIVERSITY   (China)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

^c BOGAZICI UNIVERSITY   (Turkey)

Author keywords

Fault diagnosis; improved partial least squares (IPLS); key performance indicator (KPI); Tennessee Eastman (TE) process

Indexed keywords

BENCHMARKING; FAILURE ANALYSIS; LEAST SQUARES APPROXIMATIONS; STATISTICAL TESTS;

DIAGNOSIS INFORMATION; FAULT DETECTION RATE; KEY PERFORMANCE INDICATORS; MAINTENANCE ACTION; PARTIAL LEAST SQUARE (PLS); PROCESS INDUSTRIES; PROCESS VARIABLES; TENNESSEE EASTMAN;

FAULT DETECTION;

EID: 84922882884     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIE.2014.2345331     Document Type: Article

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