High-throughput synchrotron X-ray diffraction for combinatorial phase mapping

Journal of Synchrotron Radiation

Volumn 21, Issue 6, 2014, Pages 1262-1268

  Gregoire, J M ^a   Van Campen, D G ^b   Miller, C E ^b   Jones, R J R ^a   Suram, S K ^a   Mehta, A ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

combinatorial materials science; high throughput phase mapping; X ray diffraction; X ray fluorescence

Indexed keywords

FLUORESCENCE; GENES; MAPPING; SYNCHROTRON RADIATION; THROUGHPUT; X RAY DIFFRACTION;

CHARACTERIZATION OF FIBERS; COMBINATORIAL MATERIALS SCIENCE; HIGH-THROUGHPUT MATERIALS; HIGH-THROUGHPUT METHOD; PHASE MAPPINGS; STRUCTURAL CHARACTERIZATION; SYNCHROTRON X RAY DIFFRACTION; X RAY FLUORESCENCE;

CHARACTERIZATION;

EID: 84922632892     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577514016488     Document Type: Article

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