Desorption electrospray ionization-mass spectrometric analysis of low vapor pressure chemical particulates collected from a surface

Analytica Chimica Acta

Volumn 853, Issue 1, 2015, Pages 368-374

  Ewing, K J ^a   Gibson, D ^a   Sanghera, J ^a   Miklos, F ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b SOTERA DEFENSE SOLUTIONS   (United States)

Author keywords

Collection; Desorption electrospray ionization; Low vapor pressure chemical; Mass spectrometry; Sticky screens; Surface

Indexed keywords

DESORPTION; ELECTROSPRAY IONIZATION; HYDROSTATIC PRESSURE; IONIZATION; MASS SPECTROMETRY; REFUSE COLLECTION; SILICA; SILICA GEL; SILICONES; STAINLESS STEEL; SURFACES; VAPOR PRESSURE;

ACTUAL MASS; DESORPTION ELECTROSPRAY IONIZATION; DETECTION LIMITS; LOW VAPOR PRESSURES; MASS SPECTROMETRIC ANALYSIS; POLYDIMETHYLSILOXANE PDMS; RESPONSE CURVES; TRIETHYL PHOSPHATES;

CHEMICAL ANALYSIS;

DIMETICONE; PHOSPHATE; SILICA GEL; STAINLESS STEEL; TRIETHYL PHOSPHATE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL ANALYSIS; CONTROLLED STUDY; DESORPTION ELECTROSPRAY IONIZATION MASS SPECTROMETRY; ION CURRENT; LIMIT OF DETECTION; MASS SPECTROMETRY; MATERIAL COATING; MEASUREMENT ACCURACY; MOLECULAR WEIGHT; QUANTITATIVE ANALYSIS; REPRODUCIBILITY; SAMPLER; STICKY SCREEN SAMPLER; SURFACE PROPERTY; VAPOR PRESSURE;

EID: 84922581970     PISSN: 00032670     EISSN: 18734324     Source Type: Journal    
DOI: 10.1016/j.aca.2014.09.042     Document Type: Article

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