Stable ferroelectric perovskite structure with giant axial ratio and polarization in epitaxial BiFe0.6Ga0.4O3 thin films

ACS Applied Materials and Interfaces

Volumn 7, Issue 4, 2015, Pages 2648-2653

  Fan, Zhen ^a,b   Xiao, Juanxiu ^a   Liu, Huajun ^a   Yang, Ping ^a   Ke, Qingqing ^a   Ji, Wei ^b   Yao, Kui ^b   Ong, Khuong P ^c   Zeng, Kaiyang ^a   Wang, John ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^c INSTITUTE OF HIGH PERFORMANCE COMPUTING   (Singapore)

Author keywords

BiFeO3; epitaxial thin film; ferroelectric; giant polarization; supertetragonal

Indexed keywords

BISMUTH COMPOUNDS; CALCULATIONS; ELECTRIC FIELDS; EPITAXIAL GROWTH; FERROELECTRIC FILMS; FERROELECTRIC MATERIALS; FERROELECTRICITY; GALLIUM COMPOUNDS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IRON COMPOUNDS; PEROVSKITE; POLARIZATION; SCANNING PROBE MICROSCOPY; STABILITY; X RAY DIFFRACTION ANALYSIS;

BIFEO3; EPITAXIAL THIN FILMS; FERROELECTRIC PEROVSKITES; FERROELECTRIC POLARIZATION; FIRST-PRINCIPLES CALCULATION; HIGH RESOLUTION X-RAY DIFFRACTOMETRY; PIEZORESPONSE FORCE MICROSCOPY; SUPERTETRAGONAL;

THIN FILMS;

EID: 84922423667     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am509016w     Document Type: Article

References (21)

1. Uratani, Y.; Shishidou, T.; Ishii, F.; Oguchi, T. First-Principles Predictions of Giant Electric Polarization Jpn. J. Appl. Phys. 2005, 44, 7130-7133
2. Muralt, P. Ferroelectric Thin Films for Micro-sensors and Actuators: A Review J. Micromech. Microeng. 2000, 10, 136-146
3. Dawber, M.; Rabe, K. M.; Scott, J. F. Physics of Thin-film Ferroelectric Oxides Rev. Mod. Phys. 2005, 77, 1083-1130
4. 3-based Ferroelectric Tunnel Junctions ACS Nano 2013, 7, 5385-5390
5. 3 Thin Films Adv. Mater. 2010, 22, 1763-1766
6. Ederer, C.; Spaldin, N. A. Effect of Epitaxial Strain on the Spontaneous Polarization of Thin Film Ferroelectrics Phys. Rev. Lett. 2005, 95, 257601
7. 3 Science 2009, 326, 977-980
8. Zhang, J. X.; Xiang, B.; He, Q.; Seidel, J.; Zeches, R. J.; Yu, P.; Yang, S. Y.; Wang, C. H.; Chu, Y. H.; Martin, L. W.; Minor, A. M.; Ramesh, R. Large Field-Induced Strains in a Lead-free Piezoelectric Material Nat. Nanotechnol. 2011, 6, 98-102
9. 4 Substrates Appl. Phys. Lett. 2010, 97, 242903
10. Béa, H.; Dupe, B.; Fusil, S.; Mattana, R.; Jacquet, E.; Warot-Fonrose, B.; Wilhelm, F.; Rogalev, A.; Petit, S.; Cros, V.; Aname, A.; Petroff, F.; Bouzehouane, K.; Geneste, G.; Dkhil, B.; Lisenkov, S.; Ponomareva, I.; Bellaiche, L.; Bibes, M.; Barthelemy, A. Evidence for Room-Temperature Multiferroicity in a Compound with a Giant Axial Ratio Phys. Rev. Lett. 2009, 102, 217603
11. 3 Phys. Rev. Lett. 2011, 107, 147602
12. 3 Thin Films Nano Lett. 2010, 10, 2555-2561
13. 3 Films Based on First-Principles Calculations and New Structural Data J. Phys.: Condens. Matter 2006, 18, L97-L105
14. 3 Substrates Adv. Funct. Mater. 2012, 22, 937-942
15. 3-based Perovskites: A Large Family of Polar Materials Chem. Mater. 2012, 24, 3056-3064
16. 3 Thin Films Appl. Phys. Lett. 2013, 102, 222906
17. 3 on Hexagonal Sapphire(0001) ACS Appl. Mater. Interfaces 2014, 6, 2639-2646
18. King-Smith, R. D.; Vanderbilt, D. Theory of Polarization of Crystalline Solids Phys. Rev. B 1993, 47, 1651-1654
19. Vanderbilt, D.; King-Smith, R. D. Electric Polarization as a Bulk Quantity and Its Relation to Surface Charge Phys. Rev. B 1993, 48, 4442-4455
20. Gonze, X.; Allan, D. C.; Teter, M. P. Dielectric Tensor, Effective Charges, and Phonons in α-Quartz by Variational Density-Functional Perturbation Theory Phys. Rev. Lett. 1992, 68, 3603-3606
21. Baroni, S.; Resta, R. Ab Initio Calculation of the Macroscopic Dielectric Constant in Silicon Phys. Rev. B 1986, 33, 7017-7021