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Volumn 1176, Issue , 2010, Pages
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Encoplot - Performance in the second international plagiarism detection challenge: Lab report for PAN at CLEF 2010
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Author keywords
[No Author keywords available]
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Indexed keywords
PLAGIARISM DETECTION;
INTELLECTUAL PROPERTY;
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EID: 84922051894
PISSN: 16130073
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (5)
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