메뉴 건너뛰기




Volumn , Issue , 1994, Pages 24-33

Network analyzer calibration for cryogenic on-wafer measurements

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENICS; LOW TEMPERATURE EFFECTS; PROBES; TEMPERATURE;

EID: 84921280353     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1994.327055     Document Type: Conference Paper
Times cited : (7)

References (9)
  • 1
    • 28844435219 scopus 로고
    • Cryogenic vacuum high frequency probe station
    • Sep/Oct.
    • J. Laskar and J. Kolodzey, "Cryogenic vacuum high frequency probe station", J. Vac. Sci. Technol. B 8(5), pp. 1161-1165, Sep/Oct. 1990.
    • (1990) J. Vac. Sci. Technol. B , vol.8 , Issue.5 , pp. 1161-1165
    • Laskar, J.1    Kolodzey, J.2
  • 3
    • 0026735257 scopus 로고
    • Temperature dependence of high-frequency performance of AlGaAs/InGaAs pseudomorphic HEMT's
    • Jan.
    • T. Mizutani, and K. Maezawa, "Temperature Dependence of High-Frequency Performance of AlGaAs/InGaAs Pseudomorphic HEMT's", IEEE Electron Device Lett., vol. 13, no. 1, pp. 8-10, Jan. 1992.
    • (1992) IEEE Electron Device Lett. , vol.13 , Issue.1 , pp. 8-10
    • Mizutani, T.1    Maezawa, K.2
  • 4
    • 0026628398 scopus 로고
    • Cryogenic microwave performance of 0.5-μm InGaAs MESFET's
    • January
    • S. Maranowski, J. Laskar, M. Feng, and J. Kolodzey, "Cryogenic Microwave Performance of 0.5-μm InGaAs MESFET's", IEEE Electron Device Lett., vol. 13, no. 1, pp. 64-66, January 1992.
    • (1992) IEEE Electron Device Lett. , vol.13 , Issue.1 , pp. 64-66
    • Maranowski, S.1    Laskar, J.2    Feng, M.3    Kolodzey, J.4
  • 5
    • 0026188064 scopus 로고
    • A multiline method of network analyzer calibration
    • July
    • R. B. Marks, "A Multiline Method of Network Analyzer Calibration", IEEE Trans. Microwave Theory Tech., vol. 39, no. 7, pp. 1205-1215, July 1991.
    • (1991) IEEE Trans. Microwave Theory Tech. , vol.39 , Issue.7 , pp. 1205-1215
    • Marks, R.B.1
  • 7
    • 85057204899 scopus 로고
    • LRM and LRRM calibrations with automatic determination of load inductance
    • November
    • A. Davidson, K. Jones, and E. Strid, "LRM and LRRM Calibrations with Automatic Determination of Load Inductance", 36th ARFTG Conference Digest, November, 1990.
    • (1990) 36th ARFTG Conference Digest
    • Davidson, A.1    Jones, K.2    Strid, E.3
  • 8
    • 34047189352 scopus 로고
    • Verification of LRM calibrations with load inductance compensation for CPW measurements on GaAs substrates
    • November
    • J. E. Pence, "Verification of LRM Calibrations with Load Inductance Compensation for CPW Measurements on GaAs Substrates", 42th ARFTG Conference Digest, November, 1993.
    • (1993) 42th ARFTG Conference Digest
    • Pence, J.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.