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1
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0020879241
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Theoretical, practical and analogical limits in ulsi
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Dec
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Technical Digest IEEE International Electron Devices Meeting
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Meindl, J.D.1
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2
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33747834300
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The evolution of solid state circuits: 1958-1992-20
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Meindl, J. D., "The Evolution of Solid State Circuits: 1958-1992-20", ISSCC Commemorative Supplement, pp. 23-26, Feb 1993.
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ISSCC Commemorative Supplement
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Meindl, J.D.1
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3
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0026116329
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Monte carlo simulation of transport in technoiogy significant semiconductors of the diamond and zinc-blend structures-part i: Homogeneous transport
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Mar
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Fischetti, M. V., "Monte Carlo Simulation of Transport in Technoiogy Significant Semiconductors of the Diamond and Zinc-Blend Structures-Part I: Homogeneous Transport", IEEE T. Electron Devices, vol. 38, no. 3, pp. 634-649, Mar. 1991.
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Fischetti, M.V.1
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Monte carlo simulation oftransport in technologically significant semiconductors of the diamond and zinc-blend structures-part 11: Submicrometer mosfet's
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Mar
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Fischetti, M. V., S. E. Lam, "Monte Carlo Simulation ofTransport in Technologically Significant Semiconductors of the Diamond and Zinc-Blend Structures-Part 11: Submicrometer MOSFET's", IEEE T. Electron Devices, vol. 38, no. 3, pp. 650-660, Mar. 1991.
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Fischetti, M.V.1
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Scaling the si mosfet; From bulk to so1 to bulk
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Yan, R. H., et al., "Scaling the Si MOSFET; From Bulk to SO1 to Bulk, IEEE TED, vol. 39, no. 7, pp. 1704-1710, July 1992.
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Mosfet scaling limits determined by subthreshold conduction
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Pimbley, J. M., J. D. Meindl, "MOSFET Scaling Limits Determined by Subthreshold Conduction", IEEE T. Electron Devices, vol. 36, no. 9, pp. 1711-1721, Sept. 1989.
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Meindl, J.D.2
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85065657839
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I81 De, V IC, J. D. Meindl An Analytical ThresholdVoltage and Suh-Threshold Current Model for Short-Channel MESFETs IEEE J. Solid-state Circuits, accepted for publication
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Private Communication from Bhavna Agrawal, to be published. I81 De, V. IC, J. D. Meindl, "An Analytical ThresholdVoltage and Suh-Threshold Current Model for Short-Channel MESFETs", IEEE J. Solid-state Circuits, accepted for publication.
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Private Communication from Bhavna Agrawal, to Be Published
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8
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85065643107
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An analytical threshold voltage and suh-Threshold current model for short-channel aigaas/gaas modfets
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accepted for publication
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De, V. K., J. D. Meindl, "An Analytical Threshold Voltage and Suh-Threshold Current Model for Short-Channel AIGaAs/GaAs MODFETs", IEEE J. Solid-state Circuits, accepted for publication.
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IEEE J. Solid-state Circuits
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De, V.K.1
Meindl, J.D.2
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9
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0025591828
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Comparative performance limits of mosfet, mesfet and modfet digital circuits
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May
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De, V. IC, J. D. Meindl, "Comparative Performance Limits of MOSFET, MESFET and MODFET Digital Circuits", Proc of IEEE Custom IC Conf., pp. 18.8.1-18.8.4, May 1990.
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De, V.I.C.1
Meindl, J.D.2
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10
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0015330654
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Ion implanted complementary mos transistors in low voltage circuits
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Apr
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Swanson, R. M., J. D. Meindl, "Ion Implanted Complementary MOS Transistors in Low Voltage Circuits", IEEE J. Solid-State Circuits, SC-7(2), pp. 146-153, Apr. 1972.
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Swanson, R.M.1
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11
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0022061669
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Optimal interconnection circuits for VLSI
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Bakoglu, H. B., J. D. Meindl, "Optimal Interconnection Circuits for VLSI", IEEE T. Electron Devices, ED-32-(5), pp. 903-909, May 1985.
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Bakoglu, H.B.1
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12
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0001891939
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A system-level circuit model for multi-And-single-chip cpu's
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Feb
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Bakoglu, H. B., J. D. Meindl, "A System-Level Circuit Model for Multi-And-Single-Chip CPU's", ISSCC DIGEST OF TECHNICAL PAPERS, pp. 308-309, Feb. 1987.
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Bakoglu, H.B.1
Meindl, J.D.2
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13
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0016506999
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Physical limits in digital electronics
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Keyes, R. W., "Physical Limits in Digital Electronics", Proc IEEE, vol. 63, no. 5, pp. 740-766, May 1975.
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The evolution of digital electronics towards VLSI
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