Analysis of the early-failure rate prediction of time-dependent-dielectric breakdown in thin oxides

European Solid-State Device Research Conference

Volumn , Issue , 1995, Pages 299-302

  Ogier, J L ^a   Degraeve, R ^a   Roussel, P ^a   Groeseneken, G ^a   Maes, H E ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

RATE PREDICTIONS; THIN OXIDES; TIME-DEPENDENT DIELECTRIC BREAKDOWN;

EID: 84920748477     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)