Evolution of phases in two-stage vacuum processed thin film Cu2ZnSnSe4 absorber layers

Materials Research Innovations

Volumn 18, Issue 7, 2014, Pages 515-518

  Marquez Prieto J ^a   Forbes, I ^a  

^a NORTHUMBRIA UNIVERSITY   (United Kingdom)

Author keywords

Absorber layer; CZTSe; EDS; Phase evolution; X ray diffraction

Indexed keywords

BINARY ALLOYS; COPPER ALLOYS; COPPER METALLOGRAPHY; ENERGY DISPERSIVE SPECTROSCOPY; II-VI SEMICONDUCTORS; MORPHOLOGY; TIN COMPOUNDS; X RAY DIFFRACTION; ZINC ALLOYS; ZINC METALLOGRAPHY; ZINC SELENIDE;

ABSORBER LAYERS; CZTSE; ENERGY DISPERSIVE X RAY SPECTROSCOPY; HIGHEST TEMPERATURE; LOWER TEMPERATURES; METALLIC PRECURSOR; PHASE EVOLUTIONS; TEMPERATURE INCREASE;

SELENIUM COMPOUNDS;

EID: 84918789555     PISSN: 14328917     EISSN: 1433075X     Source Type: Journal    
DOI: 10.1179/1433075X14Y.0000000248     Document Type: Article

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