Observation of quantum interference in the plasmonic Hong-Ou-Mandel effect

Physical Review Applied

Volumn 1, Issue 3, 2014, Pages

  Di Martino, G ^a   Sonnefraud, Y ^a,b   Tame, M S ^a,c   Kena Cohen S ^a,d   Dieleman, F ^a   Ozdemir S K ^e   Kim, M S ^a   Maier, S A ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^c UNIVERSITY OF KWAZULU NATAL   (South Africa)

^d ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

^e WASHINGTON UNIVERSITY IN ST LOUIS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOSONS; CHARGE DENSITY; CHARGE DENSITY WAVES; ELECTROMAGNETIC WAVE POLARIZATION; PARTICLE BEAMS; PHOTONS; PLASMONICS; QUANTUM INTERFERENCE DEVICES; SURFACE PLASMONS;

ELECTROMAGNETIC EXCITATIONS; ELECTRON CHARGE DENSITY; METAL-DIELECTRIC INTERFACE; NANOPHOTONIC DEVICES; PARAMETRIC DOWN CONVERSION; QUANTUM INTERFERENCE; SINGLE-PHOTON SOURCE; SURFACE PLASMON POLARITONS;

SURFACE PLASMON RESONANCE;

EID: 84918540527     PISSN: None     EISSN: 23317019     Source Type: Journal    
DOI: 10.1103/PhysRevApplied.1.034004     Document Type: Article

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