A General Control-Volume Formulation for Modeling Impact Ionization in Semiconductor Transport

IEEE Transactions on Electron Devices

Volumn 32, Issue 10, 1985, Pages 2076-2082

  Laux, Steven E ^a   Grossman, Bertrand M ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84916404354     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1985.22241     Document Type: Article

References (16)

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