Rapid identification of areas of interest in thin film materials libraries by combining electrical, optical, X-ray diffraction, and mechanical high-throughput measurements: A case study for the system ni-al

ACS Combinatorial Science

Volumn 16, Issue 12, 2014, Pages 686-694

  Thienhaus, S ^a   Naujoks, D ^a   Pfetzing Micklich, J ^a   Konig D ^a   Ludwig, A ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

high throughput; materials libraries; phase identification; thin films

Indexed keywords

ALLOY; ALUMINUM; NICKEL;

CHEMISTRY; COMBINATORIAL CHEMISTRY; IMPEDANCE; PROCEDURES; SCANNING ELECTRON MICROSCOPY; SYNTHESIS; X RAY DIFFRACTION; YOUNG MODULUS;

ALLOYS; ALUMINUM; COMBINATORIAL CHEMISTRY TECHNIQUES; ELASTIC MODULUS; ELECTRIC IMPEDANCE; MICROSCOPY, ELECTRON, SCANNING; NICKEL; X-RAY DIFFRACTION;

EID: 84916199826     PISSN: 21568952     EISSN: None     Source Type: Journal    
DOI: 10.1021/co5000757     Document Type: Article

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