|
Volumn 1, Issue , 2015, Pages 63-69
|
Application
|
Author keywords
Crack Depth; Fatigue Crack Growth; Limit State Function; Longitudinal Crack; Probabilistic Input
|
Indexed keywords
|
EID: 84915761390
PISSN: None
EISSN: 23636998
Source Type: Book Series
DOI: 10.1007/978-3-319-12877-1_5 Document Type: Chapter |
Times cited : (24)
|
References (2)
|