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Volumn 1, Issue 2, 1983, Pages 600-603

Hydrogen-related memory traps in thin silicon nitride films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84915289884     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.571966     Document Type: Article
Times cited : (54)

References (20)
  • 6
    • 84957282144 scopus 로고
    • The Electrochemical Society Extended Abstracts, Denver, Colorado, October 11–16 Abstract 405
    • H. J. Stein and V. J. Kapoor, The Electrochemical Society Extended Abstracts, Denver, Colorado, October 11–16, 1981, Abstract 405, p. 405.
    • (1981) , pp. 405
    • Stein, H.J.1    Kapoor, V.J.2
  • 16
    • 0008534382 scopus 로고
    • in edited by G. Lukovsky, S. T. Pantelides, and F. L. Galeener (Pergemon, New York
    • H. J. Stein, P. S. Peercy, and D. S. Ginley, in The Physics of MOS Insulators, edited by G. Lukovsky, S. T. Pantelides, and F. L. Galeener (Pergemon, New York, 1980), p. 147.
    • (1980) The Physics of MOS Insulators , pp. 147
    • Stein, H.J.1    Peercy, P.S.2    Ginley, D.S.3
  • 18
    • 84957276414 scopus 로고
    • Jpn
    • Jpn. J. Appl. Phys. 19 (1980)
    • (1980) J. Appl. Phys , vol.19
  • 19
    • 84957274048 scopus 로고    scopus 로고
    • Suppl. 19–1
    • Suppl. 19–1, p. 245.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.