Characterization of molecular-beam epitaxially grown HgTe films by Shubnikov-de Haas measurements

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 6, Issue 4, 1988, Pages 2779-2784

  Justice, R J ^a   Seiler, D G ^a   Zawadzki, W ^a   Koestner, R J ^b   Goodwin, M W ^b   Kinch, M A ^b  

^a UNIVERSITY OF NORTH TEXAS   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84914906345     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.575506     Document Type: Article

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