Characterizing application memory error vulnerability to optimize datacenter cost via heterogeneous-reliability memory

Proceedings of the International Conference on Dependable Systems and Networks

Volumn , Issue , 2014, Pages 467-478

  Luo, Yixin ^a   Govindan, Sriram ^a,b   Sharma, Bikash ^a,b   Santaniello, Mark ^a,b   Meza, Justin ^a   Kansal, Aman ^a,b   Liu, Jie ^a,b   Khessib, Badriddine ^a,b   Vaid, Kushagra ^a,b   Mutlu, Onur ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b MICROSOFT   (United States)

Author keywords

datacenter cost; DRAM; hard errors; memory architectures; memory errors; soft errors; software reliability

Indexed keywords

COST REDUCTION; DYNAMIC RANDOM ACCESS STORAGE; ERRORS; RADIATION HARDENING; SOFTWARE RELIABILITY;

DATA-INTENSIVE APPLICATION; DATA-INTENSIVE WORKLOADS; DATACENTER; HARD ERRORS; HETEROGENEOUS RELIABILITY; MEMORY ERROR; SOFT ERROR; TOTAL COST OF OWNERSHIP;

MEMORY ARCHITECTURE;

EID: 84912138346     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSN.2014.50     Document Type: Conference Paper

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