Measuring refractive index profiles within thin-film photovoltaics with high spatial resolution using the modified IM-IWKB method

2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Volumn , Issue , 2014, Pages 655-659

  Pang, Yutong ^a,b   Eisaman, Matthew D ^a,b,c  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b STONY BROOK UNIVERSITY   (United States)

^c Stony Brook University   (United States)

Author keywords

photovoltaic cells; refractive index; semiconductor films; semiconductor waveguides; solar energy; thin films

Indexed keywords

INVERSE PROBLEMS; PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; SINGLE MODE FIBERS; SOLAR ENERGY; SOLAR POWER GENERATION; THIN FILM SOLAR CELLS; THIN FILMS;

HIGH SPATIAL RESOLUTION; ORGANIC PHOTOVOLTAICS; PHASE CONTRIBUTION; PHOTOVOLTAIC MATERIALS; REFRACTIVE INDEX PROFILES; SEMICONDUCTOR FILMS; SEMICONDUCTOR WAVEGUIDE; THIN FILM PHOTOVOLTAICS;

REFRACTIVE INDEX;

EID: 84912122870     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2014.6925007     Document Type: Conference Paper

References (6)

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