Effect of thermal processing conditions on the structure and dielectric properties of PVDF films

Journal of Polymer Research

Volumn 21, Issue 11, 2014, Pages

  Tiwari, Vineet ^a   Srivastava, Geetika ^a  

^a JAYPEE INSTITUTE OF INFORMATION TECHNOLOGY   (India)

Author keywords

Crystallinity; Dielectric; FTIR; PVDF; X ray diffraction

Indexed keywords

ANNEALING; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; FLUORINE COMPOUNDS; QUENCHING; X RAY DIFFRACTION;

EFFECT OF ANNEALING; FTIR; POLY (VINYLIDENE FLUORIDE)(PVDF); PROCESSING CONDITION; PVDF; QUENCHING TEMPERATURES; SENSORS AND ACTUATORS; THERMAL PROCESSING CONDITIONS;

CRYSTALLINITY;

EID: 84911926666     PISSN: 10229760     EISSN: 15728935     Source Type: Journal    
DOI: 10.1007/s10965-014-0587-0     Document Type: Article

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