Critical configurations for radial distortion self-calibration

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn , Issue , 2014, Pages 25-32

  Wu, Changchang ^a  

^a GOOGLE INC   (United States)

Author keywords

Critical configuraiton; radial distortion self calibration

Indexed keywords

CALIBRATION;

CRITICAL CONFIGURAITON; CRITICAL CONFIGURATIONS; CRITICAL SURFACES; MOTION AND STRUCTURE; MULTI-VIEW RECONSTRUCTION; RADIAL DISTORTIONS; SELF CALIBRATION; SYNTHETIC EXPERIMENTS;

PATTERN RECOGNITION;

EID: 84911430378     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2014.11     Document Type: Conference Paper

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