Visual tracking using pertinent patch selection and masking

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn , Issue , 2014, Pages 3486-3493

  Lee, Dae Youn ^a   Sim, Jae Young ^b   Kim, Chang Su ^a  

^a Korea University   (South Korea)

^b Ulsan National Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE SEGMENTATION; TRACKING (POSITION);

APPEARANCE MODELING; APPEARANCE MODELS; BACKGROUND MODEL; MULTIPLE PATCHES; OBJECT POSITIONS; STATE OF THE ART; TRACKING ALGORITHM; VISUAL TRACKING ALGORITHM;

PATTERN RECOGNITION;

EID: 84911406830     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2014.446     Document Type: Conference Paper

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