Film Structure of Epitaxial Graphene Oxide on SiC: Insight on the Relationship between Interlayer Spacing, Water Content, and Intralayer Structure

Advanced Materials Interfaces

Volumn 1, Issue 3, 2014, Pages

  Zhou, S ^a   Kim, S ^b   Di Gennaro, E ^c,d   Hu, Y ^a   Gong, C ^f   Lu, X ^a   Berger, C ^a,f   De Heer, W ^a   Riedo, E ^a   Chabal, Y J ^e   Aruta, C ^c,d   Bongiorno, A ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b Hanyang University   (South Korea)

^c UNIVERSITY OF ROME TOR VERGATA   (Italy)

^d Dipartimento di Scienze Fisiche   (Italy)

^e The University of Texas at Dallas   (United States)

^f CNRS   (France)

Author keywords

AFM; ATR IR; DFT calculations; graphene oxide; multilayer epitaxial graphene; XRD

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON FILMS; COMPOSITE FILMS; DENSITY FUNCTIONAL THEORY; GRAPHENE; GRAPHENE OXIDE; INTERCALATION; MOLECULES; MULTILAYER FILMS; MULTILAYERS; OXIDATION; SILICON CARBIDE; X RAY DIFFRACTION;

CHEMICAL COMPLEXITY; DFT CALCULATION; EPITAXIAL GRAPHENE; INTERLAYER SEPARATION; INTERLAYER SPACINGS; MULTILAYER GRAPHENE; TECHNOLOGICAL APPLICATIONS; ULTRA-THIN OXIDE FILMS;

OXIDE FILMS;

EID: 84910621518     PISSN: None     EISSN: 21967350     Source Type: Journal    
DOI: 10.1002/admi.201300106     Document Type: Article

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