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Volumn 11, Issue 3, 2014, Pages 1-25

Hardware fault recovery for I/O intensive applications

Author keywords

Fault tolerance; Hardware reliability; I O recovery

Indexed keywords

ELECTRIC FAULT CURRENTS; FAULT TOLERANCE;

EID: 84910153509     PISSN: 15443566     EISSN: 15443973     Source Type: Journal    
DOI: 10.1145/2656342     Document Type: Article
Times cited : (6)

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