Imaging of mixing of two miscible liquids using electrical impedance tomography

5th World Congress in Industrial Process Tomography

Volumn , Issue , 2007, Pages 803-809

  Kourunen, J ^a   Heikkinen, L M ^a   Vauhkonen, M ^a   Kayhko R ^b   Matula, J ^b   Kayhko J ^c  

^a UNIVERSITY OF EASTERN FINLAND   (Finland)

^b Wetend Technologies Ltd   (Finland)

^c LAPPEENRANTA UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

3D imaging; Electrical impedance tomography; Liquid liquid mixing

Indexed keywords

ADDITIVES; ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; IMAGE RECONSTRUCTION; INDICATORS (CHEMICAL); LIQUIDS; PILOT PLANTS; TOMOGRAPHY;

3D IMAGING; CHEMICAL INJECTION SYSTEMS; CONDUCTIVITY DISTRIBUTIONS; ELECTRICAL IMPEDANCE TOMOGRAPHY; LIQUID-LIQUID MIXING; PAPERMAKING CHEMICALS; RECONSTRUCTED IMAGE; THREE DIMENSIONAL IMAGES;

MIXING;

EID: 84910140726     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. HEIKKINEN L.M., KOURUNEN J., SAVOLAINEN T., VAUHKONEN P.J., KAIPIO J.P., and VAUHKONEN M., (2006), Real time three-dimensional electrical impedance tomography applied to multiphase flow imaging, Meas. Sci. Technol.,17, 2083-2087.
2. KOURUNEN J., SAVOLAINEN T., HEIKKINEN L.M, LEHIKOINEN A., and VAUHKONEN M., (2007), Novel impedance tomography system for industrial use. To be submitted to Rev. Sci. Instrum.
3. KIM S., NKAYA N. A., and DYAKOWSKI T., (2006), Measurement of mixing of two miscible liquids in a stirred vessel with electrical resistance tomography, Int. Comm. Heat. Mass. Transfer, 33, 9, 1088-1095.
4. MANN R., WANG W., FORREST A.E., HOLDEN P.J., DICKIN F.J., DYAKOWSKI T., and EDWARDS R.B., (1999) Gas-liquid and miscible liquid mixing in a plant-scale vessel monitored using electrical resistance tomography, Chem. Eng. Comm., 175, 39-48.
5. WANG M., DORWARD A., VLAEV D., and MANN R., (2000), Measurements of gas-liquid mixing in a stirred vessel using electrical resistance tomography, Chem. Eng. J., 77, 93-98.