A multi-frequency impedance analyser for electrical tomography systems

4th World Congress in Industrial Process Tomography

Volumn , Issue , 2005, Pages 30-35

  Yin, W ^a   Dickinson, S J ^b   Peyton, A J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

Electrical tomography; Inductance spectroscopy; Multi frequency

Indexed keywords

ANALOG TO DIGITAL CONVERSION; DESIGN; FLEXIBLE ELECTRONICS; SPECTRUM ANALYSIS; TOMOGRAPHY; UNITS OF MEASUREMENT;

COMPONENT UNDER TESTS; CROSS-SPECTRAL ANALYSIS; ELECTRICAL TOMOGRAPHY; IMPEDANCE ANALYSER; IMPEDANCE SPECTRUM; INDUCTANCE SPECTROSCOPIES; MULTI FREQUENCY; WAVEFORM GENERATORS;

INDUCTIVE SENSORS;

EID: 84910121322     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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