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Volumn , Issue , 2014, Pages

Development of ferroelectric RAM (FRAM) for mass production

Author keywords

Feroelectric; FRAM; IrO Dual Sensing; PZT

Indexed keywords

FERROELECTRIC MATERIALS; FERROELECTRIC RAM; FERROELECTRICITY; IRIDIUM COMPOUNDS; SCANNING PROBE MICROSCOPY;

EID: 84910010979     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAF.2014.6922970     Document Type: Conference Paper
Times cited : (7)

References (5)
  • 1
    • 84910013019 scopus 로고    scopus 로고
    • ITRS 2011 ERD3
    • ITRS 2011 ERD3
  • 2
    • 84910013018 scopus 로고    scopus 로고
    • A reliable 1T1C FeRAM using a thermal history tracking 2T2C Dual Reference level technique for a smartcard application chip
    • S. Kawashima, I. Fukushi, K. Morita, K. Nakabayashi, M. Nakazawa, K. Yamane, T. Hirayama, and T. Endo, "A reliable 1T1C FeRAM using a thermal history tracking 2T2C Dual Reference level technique for a smartcard application chip," IEICE Transaction, Volume E90-C 2007, pp.1941-1948.
    • (2007) IEICE Transaction , vol.E90C , pp. 1941-1948
    • Kawashima, S.1    Fukushi, I.2    Morita, K.3    Nakabayashi, K.4    Nakazawa, M.5    Yamane, K.6    Hirayama, T.7    Endo, T.8
  • 5
    • 0002524851 scopus 로고
    • Fine particles, thin films and exchange anisotropy
    • G. T. Rado and H. Suhl, Eds. New York: Academic
    • Jacobs and C. P. Bean, "Fine particles, thin films and exchange anisotropy," in Magnetism, vol. III, G. T. Rado and H. Suhl, Eds. New York: Academic, 1963, pp. 271-350.
    • (1963) Magnetism , vol.6 , pp. 271-350
    • Jacobs1    Bean, C.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.