Custom silicon for finite element modelling

2nd World Congress on Industrial Process Tomography

Volumn , Issue , 2014, Pages 272-280

  Komarudin, Muhamad ^a   York, Trevor ^a   Lionheart, W R B ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Custom Silicon; Electrical Impedance Tomography; Finite Element Modelling; Programmable Resistor Networks

Indexed keywords

APPLICATION PROGRAMS; ELECTRIC IMPEDANCE TOMOGRAPHY; HARDWARE; RESISTORS; SILICON;

DESIGN CONSIDERATIONS; ELECTRICAL IMPEDANCE TOMOGRAPHY; FINITE ELEMENT MODELLING; HARDWARE IMPLEMENTATIONS; INDUSTRIAL PROCESS TOMOGRAPHY; PROGRAMMABLE RESISTORS; SILICON IMPLEMENTATION; SOFTWARE SIMULATION;

FINITE ELEMENT METHOD;

EID: 84909987169     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. CARNIERO, N. C. F., RAMIREZ-ANGULO, J., (1998), High Performance Cell for Solving Real Time Field Problems Using the Resistive Grids Method, International Symposium on Circuits and Systems, CA, USA..
2. GEIGER, R. L., (1990), VLSI design techniques for analog and digital circuits, McGraw Hill
3. LOH, W. W., (1995) An Array Processor for Real-Time Reconstruction of Tomographic Images, M.Sc. Theses, UMIST
4. PAULSON, K. S., (1992) Parallel Algorithms for Three Dimensional Electrical Impedance Tomography, Ph.D Theses, Oxford Brookes University
5. SILVESTER P, (1996), Finite Elements for Electrical Engineers, Cambridge University Press.
6. SPINK, D. M., NORAS, J. M., (1998), Recent developments in the solution of the forward problem in capacitance tomography and implications for iterative reconstruction, Nondestr. Test. Eval., 14, pp. 115-142
7. XIE, C. G. (1995), Image reconstruction, In: R A WILLIAMS, M S BECK, Process Tomography: Principles, Techniques and Applications, Butterworth-Heinemann, pp. 301-323
8. ZIENKIEWICZ, O. C., (1971), The Finite Element Method, London: McGraw-Hill.