Multiline TRL revealed

60th ARFTG Conference Digest: Measurements Needs for Emerging Technologies, ARFTG 2002

Volumn , Issue , 2002, Pages 131-155

  DeGroot, D C ^a   Jargon, J A ^a   Marks, R B ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION;

CALIBRATION METHOD; CORRECTION COEFFICIENTS; PROPAGATION CONSTANT; SEQUENCE OF EVENTS; SIMULTANEOUS EQUATIONS; THRU REFLECT LINES; TRL CALIBRATION; VECTOR NETWORK ANALYZERS;

ELECTRIC NETWORK ANALYZERS;

EID: 84908644190     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGF.2002.1218696     Document Type: Conference Paper

References (9)

1. R. B. Marks, "A multiline method of network analyzer calibration," IEEE Transactions on Microwave Theory and Techniques, vol. 39, no. 7, pp. 1205-1215, July, 1991.
2. B. Bianco, M. Parodi, S. Ridella, and F. Selvaggi, "Launcher and microstrip characterization," IEEE Transactions on Instrumentation and Measurement, vol. 25, no. 4, pp. 320-323, Dec., 1976.
3. J. A. Reynoso-Hernandez and E. Inzunza-Gonzalez, "Comparision of LRL(m), TRM, TRRM and TAR, calibration techniques using the straightforward de-embedding method," 59th ARFTG Conference Digest, June 7, 2002.
4. R. B. Marks, "Formulations of the basic vector network analyzer error model including switch terms," 50th ARFTG Conference Digest, pp. 115-126, Dec., 1997.
5. D. Rytting, "VNA error models and calibration methods," presented at ARFTG Short Course on Measurements and Metrology for RF Telecommunications, Broomfield, CO, Nov. 28, 2000.
6. J. Verspecht, F. Verbeyst, and M. Vanden Bossche, "Large-signal network analysis: Going beyond S-parameters," presented at ARFTG Short Course on Measurements and Metrology for RF Telecommunications, Broomfield, CO, Nov. 29, 2000.
7. K. C. Gupta, R. Garg, I. Bahl, and P. Bhartia, Microstrip Lines and Slotlines, 2nd ed. Norwood, MA: Artech House, 1996.
8. M. Zelen, A Survey of Numerical Analysis. New York: McGraw-Hill, 1961.
9. S. Vandenberghe, D. Schreurs, G. Carchon, B. Nauwelaers, and W. De Raedt, "S-parameter reciprocity relations, normalization, and thru-line-reflect error box completion," Int. J. RF Microwave CAE, vol. 12, pp. 418-427, 2002.