Extended X-ray absorption fine structure (EXAFS) investigations of Ti bonding environment in sputter-deposited nanocomposite TiBC/a-C thin films

IOP Conference Series: Materials Science and Engineering

Volumn 12, Issue 1, 2010, Pages

  Endrino, J L ^a   Abad, M D ^b   Gago, R ^a   Horwat, D ^c   Jimenez I ^a   Sanchez Lopez J C ^b  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b UNIVERSITY OF SEVILLE   (Spain)

^c INSTITUT JEAN LAMOUR   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTRA; ATOMIC PHYSICS; CARBON; CARBON FILMS; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; LIGHT ABSORPTION; NANOCOMPOSITES; THIN FILMS; X RAY ABSORPTION;

BONDING ENVIRONMENT; DEPOSITED FILMS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; FOURIER TRANSFORM SPECTRA; LOCAL STRUCTURE; MAGNETRON-SPUTTERING DEPOSITION; STRUCTURAL ARRANGEMENT; STRUCTURAL UNIT;

NANOCOMPOSITE FILMS;

EID: 84908417526     PISSN: 17578981     EISSN: 1757899X     Source Type: Conference Proceeding    
DOI: 10.1088/1757-899X/12/1/012012     Document Type: Conference Paper

References (3)

1. Abad M D, Cáceres D, Pogozhev Y S, Shtansky D V, Sánchez-López J C 2009 Plasma Process Polym. 6 S107-S112
2. Kaloyeros A E, Williams W S, Brown F C, Greene A E and Woodhouse J B 1988 Phys. Rev. B 37 771-774
3. Kaloyeros A E, Hoffmann M P, Williams W S, Greene A E and McMillan J A 1988 Phys. Rev. B 38 7333-7344