What do matching results of medium area mosfets reveal for large area devices in typical analog applications

European Solid-State Device Research Conference

Volumn , Issue , 1998, Pages 104-107

  Linnenbank, Carsten G ^a   Weber, Werner ^a   Kollmer, Ute ^a   Holzapfl, Birgit ^a   Sauter, Stephan ^a   Schaper, Ulrich ^a   Brederlow, Ralf ^a   Cyrusian, Sassan ^a   Kessel, Sylvia ^b   Heinrich, Roland ^b   Hoefig, Erich ^b   Knoblinger, Erich ^b   Hesener, Alfred ^b   Thewes, Roland ^a  

^a SIEMENS AG   (Germany)

^b Siemens AG HL SP e AC ^*  (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG APPLICATIONS; AVERAGING TECHNIQUE; LARGE AREA DEVICES; MATCHING BEHAVIOR; MOSFETS;

MOSFET DEVICES;

EID: 84908214794     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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3. R. Thewes et al., Proc. ESREF 1996, p. 1823.
4. J. Bastos et al., Proc. ICMTS 1995, p. 271.
5. K. Lakshmikumar et al., J. Solid-State Cir., 1986, p. 1057.
6. M. Pelgrom et al., J. Solid-State Cir., 1989, p. 1433.
7. P. Stolk et al., Tech. Dig. IEDM 1996, p. 627.
8. U. GrUnebaum at aI., Proc. ESSCIRC 1997, p. 268.
9. P. Ko, in 'Advanced MOS device physics', N. G. Einspruch, et al. ed., Academic Press, San Diego CA, 1989