A new apparatus for cylindricity measurement with uncertainty less than 25 nm

Proceedings of the 7th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2007

Volumn 2, Issue , 2007, Pages 113-116

  Thevenot, O ^a   Consejo, C ^a   Bounouh, A ^a   David, J ^a,b   Cuq, M ^c   Noire P ^c  

^a LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

^b ARTS ET MÉTIERS PARISTECH   (France)

^c Symetrie   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRODES; PRECISION ENGINEERING;

CROSS CAPACITANCES; CYLINDRICITY; CYLINDRICITY MEASUREMENT; KLITZING CONSTANTS; ONE PARTS;

UNCERTAINTY ANALYSIS;

EID: 84908152917     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. I. M. Mills, P.J. Mohr, T J Quinn, B. N. Taylor, E. R. Williams, 2005 Redefinition of the kilogram: a decision whose time has come, Metrologia 42 71-80
2. G. Trapon et al, 2003, Determination of the von Klitzing constant RK in terms of the BNM calculable capacitor-fifteen years of investigations, Metrologia 40 159-171
3. Patent n° FR 2627582-19890825, RNUR/David,1988