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Volumn , Issue , 1990, Pages 583-586
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Interface states extracted from gated diode and charge pumping measurements
a
a
SIEMENS AG
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE PUMPING MEASUREMENTS;
GATED DIODES;
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EID: 84907978569
PISSN: 19308876
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (4)
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References (0)
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