A physical characterization of dynamically stressed CMOS transistors

European Solid-State Device Research Conference

Volumn , Issue , 1991, Pages 453-456

  Bergonzoni, C ^a   Libera, G Dalla ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS TRANSISTORS; PHYSICAL CHARACTERIZATION;

EID: 84907802339     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)