Gate-Voltage-Dependent Effective Channel Length and Series Resistance of LDD MOSFET's

IEEE Transactions on Electron Devices

Volumn 34, Issue 12, 1987, Pages 2469-2475

  Hu, Genda J ^a   Chang, Chi ^a   Chia, Yu Tai ^a  

^a Sierra Semiconductor   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84907801823     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1987.23337     Document Type: Article

References (16)

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