A compact method for measuring parasitic resistances in bipolar transistors

European Solid-State Device Research Conference

Volumn , Issue , 1993, Pages 433-436

  Verzellesi, G ^a   Chantre, A ^b   Turetta, R ^a   Cappellin, M ^a   Pavan, P ^a   Zanoni, E ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b ORANGE LABS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

PARASITIC RESISTANCES;

EID: 84907709229     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)