Performance, reliability, and supply voltage reduction, with the addition of temperature as a design variable

European Solid-State Device Research Conference

Volumn , Issue , 1993, Pages 943-948

  Foty, Daniel P ^a   Nowak, Edward J ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84907697412     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)