Phase-field model for dielectric breakdown in solids

Journal of Applied Physics

Volumn 115, Issue 4, 2014, Pages

  Chaitanya Pitike, Krishna ^a   Hong, Wei ^a  

^a Iowa State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FRACTURE MECHANICS;

BREAKDOWN PHENOMENA; BREAKDOWN STRENGTHS; CONDUCTIVE CHANNELS; ELECTROSTATIC ENERGIES; FINITE ELEMENT CODES; MICROSCOPIC PROCESS; RANDOMLY DISTRIBUTED; THEORY OF FRACTURE MECHANICS;

ELECTRIC BREAKDOWN;

EID: 84907481930     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4862929     Document Type: Article

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