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Physical Review B - Condensed Matter and Materials Physics

Volumn 90, Issue 9, 2014, Pages

Picosecond strain dynamics in Ge2Sb2Te5monitored by time-resolved x-ray diffraction

(12) Fons, Paul a,b Rodenbach, Peter c Mitrofanov, Kirill V a Kolobov, Alexander V a,b Tominaga, Junji a Shayduk, Roman d,e Giussani, Alessandro c Calarco, Raffaella c Hanke, Michael c Riechert, Henning c Simpson, Robert E f Hase, Muneaki g

a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

c PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK (Germany)

d HAHN MEITNER INSTITUT (Germany)

e DESY (Germany)

f SINGAPORE UNIVERSITY OF TECHNOLOGY AND DESIGN (Singapore)

g UNIVERSITY OF TSUKUBA (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84907466170 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.90.094305 Document Type: Article

Times cited : (24)

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