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Volumn 11, Issue 9, 2014, Pages

Influence of laser intensity noise on gated CW-STED microscopy

Author keywords

Laser intensity noise; Optical pumped semiconductor laser (OPSL); Stimulated emission depletion (STED) microscopy; Time gated detection

Indexed keywords


EID: 84906819164     PISSN: 16122011     EISSN: 1612202X     Source Type: Journal    
DOI: 10.1088/1612-2011/11/9/095603     Document Type: Article
Times cited : (15)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.