-
2
-
-
0003813178
-
-
ASM International Materials Park
-
Cartz, L.: Nondestructive Testing. ASM International, Materials Park (1995)
-
(1995)
Nondestructive Testing
-
-
Cartz, L.1
-
3
-
-
0004703429
-
-
ASM International Materials Park
-
Cartz, L.: Nondestructive Testing, Radiography, Ultrasonic, Liquid Penetrant, Magnetic Particle, Eddy Current. ASM International, Materials Park (1995)
-
(1995)
Nondestructive Testing, Radiography, Ultrasonic, Liquid Penetrant, Magnetic Particle, Eddy Current
-
-
Cartz, L.1
-
4
-
-
84975602193
-
Nondestructive testing by use of TV holography and deformation phase gradient calculation
-
10.1364/AO.29.000137
-
Vikhagen, E.: Nondestructive testing by use of TV holography and deformation phase gradient calculation. Appl. Opt. 29(1), 137-144 (1990)
-
(1990)
Appl. Opt.
, vol.29
, Issue.1
, pp. 137-144
-
-
Vikhagen, E.1
-
5
-
-
80053437243
-
A new technique to detect defect size and depth in composite structures using digital shearography and unconstrained optimization
-
De Angelis, G., Meo, M., Almond, D.P., Pickering, S.G., Angioni, S.L.: A new technique to detect defect size and depth in composite structures using digital shearography and unconstrained optimization. Nondestruct. Test. Eval. Int. 45(1), 91-96 (2012)
-
(2012)
Nondestruct. Test. Eval. Int.
, vol.45
, Issue.1
, pp. 91-96
-
-
De Angelis, G.1
Meo, M.2
Almond, D.P.3
Pickering, S.G.4
Angioni, S.L.5
-
7
-
-
0036752810
-
Introduction to NDT by active infrared thermography
-
Maldague, X.P.V.: Introduction to NDT by active infrared thermography. Mater. Eval. 60(9), 1060-1073 (2002) (Pubitemid 35221056)
-
(2002)
Materials Evaluation
, vol.60
, Issue.9
, pp. 1060-1073
-
-
Maldague, X.P.V.1
-
8
-
-
77955468942
-
Quantitative evaluation of angular defects by pulsed eddy current thermography
-
Zainal Abidin, I., Yun Tian, G., Wilson, J., Yang, S., Almond, D.: Quantitative evaluation of angular defects by pulsed eddy current thermography. Nondestruct. Test. Eval. Int. 43(7), 537-546 (2010)
-
(2010)
Nondestruct. Test. Eval. Int.
, vol.43
, Issue.7
, pp. 537-546
-
-
Zainal Abidin, I.1
Yun Tian, G.2
Wilson, J.3
Yang, S.4
Almond, D.5
-
9
-
-
77955266289
-
Physics-based image enhancement for infrared thermography
-
Holland, S.D., Renshaw, J.: Physics-based image enhancement for infrared thermography. Nondestruct. Test. Eval. Int. 43(5), 440-445 (2010)
-
(2010)
Nondestruct. Test. Eval. Int.
, vol.43
, Issue.5
, pp. 440-445
-
-
Holland, S.D.1
Renshaw, J.2
-
10
-
-
0035492988
-
Development of a new crack identification technique based on near-tip
-
DOI 10.1299/jsmea.44.528
-
Sakagami, T., Kubo, S.: Development of a new crack identification technique based on near-tip singular electrothermal field measured by lock-in infrared thermography. JSME Int. J. Ser. A 44(4), 528-534 (2001) (Pubitemid 34039291)
-
(2001)
JSME International Journal, Series A: Solid Mechanics and Material Engineering
, vol.44
, Issue.4
, pp. 528-534
-
-
Sakagami, T.1
Kubo, S.2
-
11
-
-
78751581581
-
Crack imaging by scanning pulsed laser spot thermography
-
Li, T., Almond, D.P., Andrew, D., Rees, S.: Crack imaging by scanning pulsed laser spot thermography. Nondestruct. Test. Eval. Int. 44, 216-225 (2011)
-
(2011)
Nondestruct. Test. Eval. Int.
, vol.44
, pp. 216-225
-
-
Li, T.1
Almond, D.P.2
Andrew, D.3
Rees, S.4
-
13
-
-
9344234342
-
Nothing but the cracks: A new kind of photothermal camera
-
Copenhagen
-
Legrandjacques, L., Krapez, J.-C., Lepoutre, F., Balageas, D.: Nothing but the cracks: a new kind of photothermal camera. In: Proceedings of 7th European Conference on Nondestructive Testing, Copenhagen (1998)
-
(1998)
Proceedings of 7th European Conference on Nondestructive Testing
-
-
Legrandjacques, L.1
Krapez, J.-C.2
Lepoutre, F.3
Balageas, D.4
-
14
-
-
84906553522
-
Optimization of the photothermal camera of crack detection
-
Lodz, Poland
-
Krapez, J.-C., Legrandjacques, L., Lepoutre, F., Balageas, D.: Optimization of the photothermal camera of crack detection. QIRT 1998 Archives: Documents and sessions presented during the 4th Conference on QIRT, Lodz, Poland (1998)
-
(1998)
QIRT 1998 Archives: Documents and Sessions Presented during the 4th Conference on QIRT
-
-
Krapez, J.-C.1
Legrandjacques, L.2
Lepoutre, F.3
Balageas, D.4
-
15
-
-
84880207931
-
Flying laser spot thermography for the fast detection of surface breaking cracks
-
Durban, South Africa
-
Schlighting, J., Ziegler, M., Maierhofer, C., Kreutzbruck, M.: Flying laser spot thermography for the fast detection of surface breaking cracks. In: 18th Word Conference on Nondestructive Testing, Durban, South Africa (2012)
-
(2012)
18th Word Conference on Nondestructive Testing
-
-
Schlighting, J.1
Ziegler, M.2
Maierhofer, C.3
Kreutzbruck, M.4
-
16
-
-
79951931831
-
Crack imaging by scanning laser line thermography and laser spot thermography
-
035701 10.1088/0957-0233/22/3/035701
-
Li, T., Almond, D.P., Rees, D.A.S.: Crack imaging by scanning laser line thermography and laser spot thermography. Meas. Sci. Technol. 22(3), 035701 (2011)
-
(2011)
Meas. Sci. Technol.
, vol.22
, Issue.3
-
-
Li, T.1
Almond, D.P.2
Rees, D.A.S.3
-
17
-
-
0002811442
-
Parallel thermal wave imaging using a vector lock-in video technique
-
Hess J. Petzl (eds) Springer Heidelberg
-
Kuo, P.K., Feng, Z.J., Ahmed, T., Favro, L.D., Thomas, R.L., Hartikainen, J.: Parallel thermal wave imaging using a vector lock-in video technique. In: Hess, P., Petzl, J. (eds.) Photoacoustic and Photothermal Phenomena, pp. 415-418. Springer, Heidelberg (1987)
-
(1987)
Photoacoustic and Photothermal Phenomena
, pp. 415-418
-
-
Kuo, P.K.1
Feng, Z.J.2
Ahmed, T.3
Favro, L.D.4
Thomas, R.L.5
Hartikainen, J.6
-
18
-
-
77950825363
-
From photothermal radiometry to lock-in thermography methods
-
012003 10.1088/1742-6596/214/1/012003
-
Busse, G.: From photothermal radiometry to lock-in thermography methods. J. Phys. Conf. Ser. 214, 012003 (2010)
-
(2010)
J. Phys. Conf. Ser.
, vol.214
-
-
Busse, G.1
-
19
-
-
77953737883
-
-
2 Springer Series in Advanced Microelectronics 10 Springer Berlin
-
Breitenstein, O., Warta, W., Langenkamp, M.: Lock-in Thermography, Basics and Use for Evaluating Electronic Devices and Materials, 2nd edn. Springer Series in Advanced Microelectronics, vol. 10. Springer, Berlin (2010)
-
(2010)
Lock-in Thermography, Basics and Use for Evaluating Electronic Devices and Materials
-
-
Breitenstein, O.1
Warta, W.2
Langenkamp, M.3
-
21
-
-
0037283177
-
Progress in phase angle thermography
-
10.1063/1.1524010
-
Dillenz, A., Zweschper, T., Riegert, G., Busse, G.: Progress in phase angle thermography. Rev. Sci. Instrum. 74, 417-419 (2003)
-
(2003)
Rev. Sci. Instrum.
, vol.74
, pp. 417-419
-
-
Dillenz, A.1
Zweschper, T.2
Riegert, G.3
Busse, G.4
|